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BS EN 62493:2015+A1:2022 Assessment of lighting equipment related to human exposure to electromagnetic fields, 2022
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- CONTENTS
- FOREWORD
- INTRODUCTION
- 1 Scope
- 2 Normative references
- 3 Terms, definitions, physical quantities, units and abbreviations [Go to Page]
- 3.1 Terms and definitions
- 3.2 Physical quantities and units
- Tables [Go to Page]
- Table 1 – Physical quantities and units
- 3.3 Abbreviations
- 4 Limits [Go to Page]
- 4.1 General
- 4.2 Unintentional radiating part of lighting equipment [Go to Page]
- 4.2.1 General
- 4.2.2 Lighting equipment deemed to comply with the Van der Hoofden test without testing
- 4.2.3 Application of limits
- 4.3 Intentional radiating part of lighting equipment
- 5 General requirements Van der Hoofden test [Go to Page]
- 5.1 Measurand
- 5.2 Supply voltage and frequency
- Figures [Go to Page]
- Figure 1 – Compliance routes and pass/fail criteria for lighting equipment
- 5.3 Measurement frequency range
- 5.4 Ambient temperature
- 5.5 Measurement equipment requirements
- Table 2 – Receiver or spectrum analyser settings
- Figure 2 – The Van der Hoofden test head
- Figure 3 – Example of a protection circuit
- 5.6 Measurement instrumentation uncertainty
- 5.7 Test report
- 5.8 Evaluation of results
- 6 Measurement procedure for the Van der Hoofden test [Go to Page]
- 6.1 General
- 6.2 Operating conditions [Go to Page]
- 6.2.1 Operating conditions for lighting equipment
- 6.2.2 Operating conditions for specific lighting equipment
- 6.2.3 Operating conditions for lighting equipment with intentional radiators
- 6.3 Measurement distance
- 6.4 Measurement set-up [Go to Page]
- 6.4.1 General
- 6.4.2 Measurement set-up for specific lighting equipment
- 6.5 Location of measurement test head
- Figure 4 – Measurement set-up
- 6.6 Calculation of the results
- 7 Assessment procedure intentional radiators [Go to Page]
- 7.1 General
- 7.2 Low-power exclusion method [Go to Page]
- 7.2.1 General
- 7.2.2 Determination of the total radiated power
- 7.2.3 Determination of the low-power exclusion level
- 7.2.4 Summation of multiple transmitters
- 7.3 Application of the EMF product standard for body worn-equipment
- 7.4 Application of the EMF product standard for base stations
- 7.5 Application of another EMF standard
- Figure 5 – Compliance demonstration procedure for the intentional-transmitter part of the lighting equipment
- Annexes [Go to Page]
- Annex A (normative) Measurement distances
- Table A.1 – Lighting equipment and measurement distances
- Annex B (informative) Location of measurement test head
- Figure B.1 – Location of measurement point in the transverse direction of lighting equipment – side view
- Figure B.2 – Location of measurement points in the longitude direction of lighting equipment – side view
- Figure B.3 – Location of measurement points in the longitude direction of lighting equipment; in the direction of illumination
- Figure B.4 – Location of measurement point for lighting equipment with rotationally symmetrical dimensions
- Figure B.5 – Location of measurement point for lighting equipment with rotationally symmetrical dimensions; in the direction of illumination
- Figure B.6 – Location of measurement point for lighting equipment with the same dimensions in the x- and y- axis
- Figure B.7 – Location of measurement point(s) for lighting equipment with single capped lamp (360° illumination)
- Figure B.8 – Location of measurement points for lighting equipment with a remote controlgear
- Figure B.9 – Location of measurement point for an independent electronic converter
- Figure B.10 – Location of measurement point(s) for an uplighter (floor standing/suspended)
- Annex C (informative) Exposure limits [Go to Page]
- C.1 General
- C.2 ICNIRP basic restrictions [Go to Page]
- C.2.1 Basic restrictions - SAR
- C.2.2 Basic restrictions – Internal electric field
- C.2.3 Changes introduced by ICNIRP 2020 with respect to ICNIRP 1998 and ICNIRP 2010
- Table C.1 – Basic restrictions for general public exposure to time varying electric and magnetic fields for frequencies between 100 kHz and 300 GHz
- Table C.2 – Basic restrictions for general public exposure to time varying electric and magnetic fields for frequencies up to 10 MHz [Go to Page]
- C.3 IEEE
- Table C.3 – IEEE basic restrictions (BR) for the general public
- Table C.4 – IEEE basic restrictions (BR) between 100 kHz and 3 GHz for the general public
- Annex D (informative) Rationale measurement and assessment method [Go to Page]
- D.1 General
- D.2 Induced internal electric field [Go to Page]
- D.2.1 General
- Figure D.1 – Overview measurement and assessment method [Go to Page]
- [Go to Page]
- D.2.2 Induced electric field due to the magnetic field; Eeddy(fi,dloop)
- Figure D.2 – Distances of the head, loop and measurement set-up
- Table D.1 – Induced internal electric field calculations
- Figure D.3 – Maximum current in the 2 m LLA as function of the frequency
- Figure D.4 – Induced internal electric field and associated limit levels [Go to Page]
- [Go to Page]
- D.2.3 Induced electric field due to the electric field; Ecap(fi,d)
- Figure D.5 – Example of magnetic-field test result using the LLA
- Figure D.6 – Distances of the head and measurement set-up
- Figure D.7 – Plot of Equation (D.20)
- Table D.2 – Calculation main contributions [Go to Page]
- D.3 Thermal effects from 100 kHz to 300 GHz [Go to Page]
- D.3.1 General
- Table D.3 – Frequency steps for the amplitude addition that equals 1,11 times B6 [Go to Page]
- [Go to Page]
- D.3.2 The 100 kHz to 30 MHz contribution to the thermal effects
- Table D.4 – Frequency steps for the power addition that equals 0,833 times B6 [Go to Page]
- [Go to Page]
- D.3.3 The 30 MHz to 300 MHz contribution to the thermal effects
- Figure D.8 – Example of the CM-current measured using a conducted emission test
- Table D.5 – Field strength limits according to CISPR 15 [Go to Page]
- [Go to Page]
- D.3.4 Overall conclusion for the contribution to thermal effects
- Annex E (normative) Practical internal electric-field measurement and assessment method [Go to Page]
- E.1 Measurement of induced internal electric field
- E.2 Calculation program
- E.3 Compliance criterion for the Van der Hoofden head test
- Table E.1 – Conductivity as a function of frequency (see Table C.1 of IEC 62311:2007)
- Annex F (normative) Protection network [Go to Page]
- F.1 Calibration of the protection network
- Figure F.1 – Test set-up for normalization of the network analyser [Go to Page]
- F.2 Calculation of the theoretical characteristic of the protection network
- Figure F.2 – Test set-up for measurement of the voltage division factor using a network analyser
- Figure F.3 – Calculated theoretical characteristic for the calibration of the protection network
- Annex G (informative) Measurement instrumentation uncertainty
- Table G.1 – Uncertainty calculation for the measurement method described in Clauses 5 and 6 in the frequency range from 20 kHz to 10 MHz
- Table G.2 – Comments and information to Table G.1
- Annex H (informative) Equipment deemed to comply
- Figure H.1 – Flow chart to determine applicability deemed to comply without F factor measurement
- Annex I (informative) Intentional radiators [Go to Page]
- I.1 General
- I.2 Intentional radiators in lighting equipment
- I.3 Properties of antennas in lighting applications
- Table I.1 – Overview of wireless radio technologies that might be applied in lighting systems
- Figure I.1 – Luminaire with a transmitting antenna in a room
- Figure I.2 – Impact of a conducting ceiling/plane
- Figure I.3 – Electric field of a small electrical dipole: analytical formula vs far-field approximation
- Figure I.4 – Electric field as a function of distance, antenna gain and input power (far-field approximation) [Go to Page]
- I.4 Exposure assessment approach [Go to Page]
- I.4.1 General
- I.4.2 Determination of average total radiated power Pint,rad
- Figure I.5 – Impact of pulsed signals on the average exposure [Go to Page]
- [Go to Page]
- I.4.3 Determination of the low-power exclusion level Pmax
- I.5 Multiple transmitters in a luminaire
- I.6 Exposure to multiple luminaires
- I.7 References in Annex I
- Bibliography [Go to Page]