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BS EN IEC 60384-22:2019 Fixed capacitors for use in electronic equipment - Sectional specification. Fixed surface mount multilayer capacitors of ceramic dielectric, Class 2, 2019
- undefined
- Annex ZA(normative)Normative references to international publicationswith their corresponding European publications
- English [Go to Page]
- CONTENTS
- FOREWORD
- 1 Scope
- 2 Normative references
- 3 Terms and definitions
- 4 Information to be given in a detail specification [Go to Page]
- 4.1 General
- 4.2 Outline drawing and dimensions
- 4.3 Mounting
- 4.4 Rating and characteristics [Go to Page]
- 4.4.1 General
- 4.4.2 Nominal capacitance range
- 4.4.3 Particular characteristics
- 4.4.4 Soldering
- 4.5 Marking
- 5 Marking [Go to Page]
- 5.1 General
- 5.2 Information for marking
- 5.3 Marking on the body
- 5.4 Requirements for marking
- 5.5 Marking of the packaging
- 5.6 Additional marking
- 6 Preferred ratings and characteristics [Go to Page]
- 6.1 Preferred characteristics
- 6.2 Preferred values of ratings [Go to Page]
- 6.2.1 Rated temperature (TR)
- 6.2.2 Rated voltage (UR)
- 6.2.3 Category voltage (UC)
- 6.2.4 Preferred values of nominal capacitance and associated tolerance values
- Table 1 – Preferred values of category voltages [Go to Page]
- 6.2.5 Temperature characteristic of capacitance
- 6.2.6 Dimensions
- Tables [Go to Page]
- Table 2 – Preferred tolerances
- Table 3 – Temperature characteristic of capacitance
- 7 Quality assessment procedures [Go to Page]
- 7.1 Primary stage of manufacture
- 7.2 Structurally similar components
- 7.3 Certified records of released lots
- 7.4 Qualification approval [Go to Page]
- 7.4.1 General
- 7.4.2 Qualification approval on the basis of the fixed sample size procedures
- 7.4.3 Tests
- Table 4 – Fixed sample size test plan for qualification approval – Assessment level EZ
- Table 5 – Tests schedule for qualification approval
- 7.5 Quality conformance inspection [Go to Page]
- 7.5.1 Formation of inspection lots
- 7.5.2 Test schedule
- 7.5.3 Delayed delivery
- 7.5.4 Assessment levels
- 8 Test and measurement procedures [Go to Page]
- 8.1 General
- Table 6 – Lot-by-lot inspection
- Table 7 – Periodic test
- 8.2 Special preconditioning
- 8.3 Measuring conditions
- 8.4 Mounting
- 8.5 Visual examination and check of dimensions [Go to Page]
- 8.5.1 General
- 8.5.2 Visual examination
- 8.5.3 Requirements
- Figures [Go to Page]
- Figure 1 – Fault: crack or fissure
- Figure 2 – Fault: crack or fissure
- Figure 3 – Separation or delamination
- Figure 4 – Exposed electrodes
- 8.6 Electrical tests [Go to Page]
- 8.6.1 Capacitance
- 8.6.2 Tangent of loss angle (tan δ )
- Figure 5 – Principal faces
- Table 8 – Measuring conditions [Go to Page]
- 8.6.3 Insulation resistance
- Table 9 – Tangent of loss angle limits [Go to Page]
- 8.6.4 Voltage proof
- 8.6.5 Impedance (if required by the detail specification)
- Table 10 – Test voltages [Go to Page]
- 8.6.6 Equivalent series resistance [ESR] (if required by the detail specification)
- 8.7 Temperature characteristic of capacitance [Go to Page]
- 8.7.1 Special preconditioning
- 8.7.2 Measuring conditions
- 8.7.3 Requirements
- 8.8 Shear test
- 8.9 Substrate bending test [Go to Page]
- 8.9.1 General
- Table 11 – Details of measuring conditions [Go to Page]
- 8.9.2 Initial measurement
- 8.9.3 Final inspection
- 8.10 Resistance to soldering heat [Go to Page]
- 8.10.1 General
- 8.10.2 Special preconditioning
- 8.10.3 Initial measurement
- 8.10.4 Test conditions
- 8.10.5 Recovery
- 8.10.6 Final inspection, measurements and requirements
- Figure 6 – Reflow temperature profile
- Table 12 – Reflow temperature profiles for Sn-Ag-Cu alloy
- 8.11 Solderability [Go to Page]
- 8.11.1 General
- 8.11.2 Test conditions
- Table 13 – Maximum capacitance change [Go to Page]
- 8.11.3 Recovery
- 8.11.4 Final inspection, measurements and requirements
- 8.12 Rapid change of temperature [Go to Page]
- 8.12.1 General
- 8.12.2 Special preconditioning
- 8.12.3 Initial measurement
- 8.12.4 Number of cycles
- 8.12.5 Recovery
- 8.12.6 Final inspection, measurements and requirements
- 8.13 Climatic sequence [Go to Page]
- 8.13.1 General
- 8.13.2 Special preconditioning
- 8.13.3 Initial measurement
- 8.13.4 Dry heat
- 8.13.5 Damp heat, cyclic, Test Db, first cycle
- 8.13.6 Cold
- 8.13.7 Damp heat, cyclic, Test Db, remaining cycles
- Table 14 – Maximum capacitance change [Go to Page]
- 8.13.8 Final inspection, measurements and requirements
- 8.14 Damp heat, steady state [Go to Page]
- 8.14.1 General
- 8.14.2 Special preconditioning
- 8.14.3 Initial measurement
- 8.14.4 Test conditions
- Table 15 – Number of damp heat cycles
- Table 16 – Final inspection, measurements and requirements [Go to Page]
- 8.14.5 Recovery
- 8.14.6 Final inspection, measurements and requirements
- 8.15 Endurance [Go to Page]
- 8.15.1 General
- Table 17 – Test conditions for damp heat, steady state
- Table 18 – Final inspection, measurements and requirements [Go to Page]
- 8.15.2 Special preconditioning
- 8.15.3 Initial measurement
- 8.15.4 Test conditions
- 8.15.5 Recovery
- 8.15.6 Final inspection, measurements and requirements
- Table 19 – Endurance test conditions (UC = UR)
- Table 20 – Endurance test conditions (UC ≠ UR)
- 8.16 Robustness of terminations (only for capacitors with strip termination) [Go to Page]
- 8.16.1 General
- 8.16.2 Test conditions
- 8.16.3 Final inspection and requirements
- 8.17 Component solvent resistance (if required)
- 8.18 Solvent resistance of the marking (if required)
- 8.19 Accelerated damp heat, steady state (if required) [Go to Page]
- 8.19.1 General
- 8.19.2 Initial measurement
- Table 21 – Final inspection, measurements and requirements of endurance test [Go to Page]
- 8.19.3 Conditioning
- 8.19.4 Recovery
- 8.19.5 Final measurements
- Table 22 – Initial requirements
- Table 23 – Conditioning
- Annex A (normative) Guidance for the specification and coding of dimensions of fixed surface mount multilayer capacitors of ceramic dielectric, Class 2 [Go to Page]
- Figure A.1 – Dimensions
- Table A.1 – Dimensions
- Annex B (informative) Capacitance ageing of fixed capacitors of ceramic dielectric, Class 2 [Go to Page]
- B.1 General
- B.2 Law of capacitance ageing
- B.3 Capacitance measurements and capacitance tolerance
- B.4 Special preconditioning (see 8.2)
- Annex C (informative) Temperature characteristics of capacitance for the reference temperature of 25 °C [Go to Page]
- Table C.1 – Temperature characteristics of capacitance for the reference temperature of 25 °C
- Table C.2 – Measuring conditions of temperature characteristic of capacitance for the reference temperature of 25 °C
- Annex X (informative) Cross-reference for reference to IEC 60384-22:2011 [Go to Page]
- Table X.1 – Reference to IEC 60384-22 for clause/subclause
- Table X.2 – Reference to IEC 60384-22 for figure/table
- Bibliography [Go to Page]