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BS IEC 61000-4-23:2016 Electromagnetic Compatibility (EMC) - Testing and measurement techniques. Test methods for protective devices for HEMP and other radiated disturbances, 2021
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- CONTENTS
- FOREWORD
- INTRODUCTION
- 1 Scope
- 2 Normative references
- 3 Terms and definitions
- 4 HEMP test concepts [Go to Page]
- 4.1 General
- 4.2 Testing of shielding enclosures [Go to Page]
- 4.2.1 General
- Figures [Go to Page]
- Figure 1 – Example of measured magnitude and phase of the transfer function T(ω) = Hin/Hout for a shielded enclosure
- Figure 2 – Electric field and magnetic field shielding effectiveness of a 0,5 mm thick aluminum enclosure [29] [Go to Page]
- 4.2.2 Buildings
- Figure 3 – Measured magnetic field shielding effectiveness SEH for a building
- Figure 4 – Conceptual illustration of the HEMP test of a building [Go to Page]
- 4.2.3 Shelters and shielded rooms
- 4.2.4 Cabinets, racks and boxes
- Figure 5 – Illustration of a shielded room or enclosure excited by HEMP fields
- Figure 6 – Illustration of equipment racks, cabinets and box excited by internal HEMP disturbance
- Figure 7 – A general shield excited by current injection
- 4.3 Testing of shielded cables and connectors [Go to Page]
- 4.3.1 General
- 4.3.2 Testing of cable shields
- Figure 8 – Basic configuration for transfer impedance measurement
- Figure 9 – Measured transfer impedance magnitude and phase of transfer impedance per unit length for four braided shield cables with good shielding properties [Go to Page]
- 4.3.3 Testing of cable connectors
- Figure 10 – Basic configuration for transfer admittance measurement
- Figure 11 – Test configuration for transfer impedance measurement of a cable connector
- 4.4 Testing of shielding materials [Go to Page]
- 4.4.1 General
- 4.4.2 Conducting gaskets
- Figure 12 – Examples of conducting gaskets used as HEMP protection devices
- Figure 13 – Circuit model representing the behaviour of a conducting gasket for HEMP protection [Go to Page]
- 4.4.3 Conducting sheets and screens
- Figure 14 – Measurement configuration for the resistivity of a sample
- Figure 15 – Test concept for measuring the resistivity with surface probes [Go to Page]
- 4.4.4 Cut-off waveguides and honeycombs
- Figure 16 – Concepts for shielding effectiveness measurement of conducting sheets and screens
- Figure 17 – Example of the calculated plane-wave shielding effectivenes sof a 0,01 mm thick plate of different material as a function of frequency
- 4.5 Summary of test concepts
- Figure 18 – Cut-off waveguides and honeycomb used as protective elements
- 5 Test methods for measuring the shielding effectiveness of HEMP protection facilities [Go to Page]
- 5.1 General
- 5.2 Electromagnetic field testing [Go to Page]
- 5.2.1 General
- 5.2.2 Pulse field testing
- Tables [Go to Page]
- Table 1 – Recommended test procedure for different test objects
- Figure 19 – Examples of full-scale, pulse-radiating HEMP simulators
- Figure 20 – Test procedure for the pulse test [Go to Page]
- 5.2.3 CW field testing
- Figure 21 – Typical configuration of a CW test facility
- Figure 22 – Example CW measurement set-up
- Figure 23 – Test and analysis procedures for conducting a CW test
- Figure 24 – Analysis flow diagram for extrapolatinga measured CW spectrum to the HEMP response
- Figure 25 – Example scan from 9 kHz to 3 GHz for the ambient electromagnetic field from communication signals
- Figure 26 – Test procedure for the ambient EM excitation test
- Figure 27 – Double-ended TEM cell for field illumination testing of small enclosures
- Figure 28 – Example test set-up for field illumination in the TEM cell
- Figure 29 – Illustration of the single-ended TEM cell and associated equipment
- Figure 30 – Test set-up for the plane-wave shielding effectiveness measurements
- Table 2 – Dimensions and composition of distances d1 to d3, with reference to Figure 30
- Figure 31 – Test set-up for the H-field shielding effectiveness measurements
- Table 3 – Dimensions and composition of distances d1 to d3, with reference to Figure 31
- Figure 32 – Example of antenna locations for the localized antenna tests for a hypothetical shielded enclosure or facility
- Table 4 – Measurement frequencies and antennas in plane-wave
- Table 5 – Measurement frequencies and antennas in magnetic field
- 5.3 Current injection test procedures [Go to Page]
- 5.3.1 General
- 5.3.2 Injection testing of enclosures
- Figure 33 – Test concept and equipment configuration for current injection testing of a shielded enclosure or box [Go to Page]
- 5.3.3 Transfer impedance and admittance of cable shields and connectors
- 5.3.4 Testing of gasket material
- Figure 34 – Surface probe for volume resistivity measurement
- Annexes [Go to Page]
- Annex A (informative) HEMP test concepts for electrical systems [Go to Page]
- A.1 Overview
- A.2 Types of HEMP tests [Go to Page]
- A.2.1 General
- A.2.2 System-level transient tests
- A.2.3 CW field illumination tests
- A.2.4 Current injection testing
- A.2.5 Partial illumination testing
- A.2.6 Subsystem and component testing
- A.3 Definition of the testing interface
- Figure A.1 – Sample HEMP interaction diagram illustrating penetration mechanisms, system responses and generic test interface locations [Go to Page]
- A.4 Use of test data [Go to Page]
- A.4.1 General
- A.4.2 Acceptance of new systems
- A.4.3 System assessments
- A.4.4 Hardness surveillance monitoring
- A.4.5 System design
- A.5 Testing uncertainties
- Annex B (informative) Characterization of shielded cables [Go to Page]
- B.1 Fundamentals of cable shielding
- Figure B.1 – Geometry of a shielded coaxial line with an internal circuit [Go to Page]
- B.2 Definitions of transfer impedance and transfer admittance
- Figure B.2 – Coaxial cable located over a conducting ground plane
- Figure B.3 – Two per-unit-length circuits formed by the sheath and its ground return, and the sheath and the internal conductor [Go to Page]
- B.3 Relative significance of Z′t and Y′t
- Annex C (informative) Equipment for HEMP pulse measurements [Go to Page]
- C.1 General
- C.2 Sensors for HEMP measurements [Go to Page]
- C.2.1 B- and H-field sensors
- Figure C.1 – Magnetic field sensors [23]
- Figure C.2 – Single-slot, cylindrical coil sensor [23] [Go to Page]
- [Go to Page]
- C.2.2 D- and E-field sensors
- Figure C.3 – Two- and four-slot cylindrical coil sensors [23]
- Figure C.4 – Electrical configuration of an E-field sensor [23]
- Figure C.5 – Biconical E-field sensor
- Figure C.6 – E-field sensor mounted on a conducting ground plane [23]
- Figure C.7 – Equipotential shapes for an optimally designed E-field sensor [23] [Go to Page]
- [Go to Page]
- C.2.3 Current sensors
- Figure C.8 – Rogowski coil used for current measurements [23]
- Figure C.9 – Toroidal current sensor made of magnetic material [23]
- Figure C.10 – Voltage pick-up points on the edges of the toroidal sensor [23] [Go to Page]
- C.3 Signal transmission [Go to Page]
- C.3.1 General
- C.3.2 Fibre optic links
- Figure C.11 – Example of a single-channel fibre optic transmission system [23] [Go to Page]
- [Go to Page]
- C.3.3 Fibre optic transducers
- C.4 Signal detection and processing
- Figure C.12 – Attenuation of coaxial linesand fibre optic cables as a function of frequency
- Annex D (informative) Equipment for CW testing [Go to Page]
- D.1 General
- D.2 Antenna system
- Figure D.1 – Various antennas for CW testing [Go to Page]
- D.3 Power amplifier
- Figure D.2 – Relationship between the CW antenna and the incident HEMP field [Go to Page]
- D.4 Receiver (network analyser)
- D.5 Reference and response sensors
- Figure D.3 – Incident and ground-reflected field contributions to the reference sensor excitations [Go to Page]
- D.6 Fibre optic system
- Figure D.4 – Measured reference H-field spectrum and its inverse Fourier transform
- Figure D.5 – Measured sensor responses and calibration function
- Figure D.6 – Measured transfer function, corrected by calibration file [Go to Page]
- D.7 Limitations of measurements
- Annex E (informative) Characterization of a planar shield for HEMP protection [Go to Page]
- E.1 General
- Figure E.1 – Example of a general shielding problem [Go to Page]
- E.2 Problem geometry
- Figure E.2 – Behaviour of the impedance ratio |E|/|H | as a function of distance from a source [29] [Go to Page]
- E.3 Equivalent circuit representation [Go to Page]
- E.3.1 General
- Figure E.3 – Conducting slab of thickness, d, and infinite extent serving as an electromagnetic barrier [Go to Page]
- [Go to Page]
- E.3.2 Chain parameter representation of the shield
- Figure E.4 – Equivalent circuit representation of the shielding problem [Go to Page]
- [Go to Page]
- E.3.3 Circuit responses
- Figure E.5 – Two-port representation of a circuit
- Table E.1 – Surface resistance and electrical parameters for selected materials
- Annex F (informative) Inside-to-out measurement method [Go to Page]
- F.1 Purpose
- F.2 Comparison of existing SE test methods
- F.3 Inside-to-out SE test of shielded rooms [Go to Page]
- F.3.1 Measurements of the inside-to-out SE
- Table F.1 – Comparison with other standards
- Table F.2 – Test shielded rooms
- Figure F.1 – Test set-up for the outside-to-in and inside-to-out SE measurement [Go to Page]
- [Go to Page]
- F.3.2 Summary
- Table F.3 – Comparison of the SE measurement results
- Bibliography [Go to Page]
