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BS EN IEC 61007:2020 Transformers and inductors for use in electronic and telecommunication equipment. Measuring methods and test procedures, 2021
- undefined
- Annex ZA(normative)Normative references to international publicationswith their corresponding European publications
- English [Go to Page]
- CONTENTS
- FOREWORD
- 1 Scope
- 2 Normative references
- 3 Terms and definitions
- Figures [Go to Page]
- Figure 1 – Pulse waveform parameters
- 4 Test procedures [Go to Page]
- 4.1 Test and measurement conditions [Go to Page]
- 4.1.1 General
- Tables [Go to Page]
- Table 1 – Recommended tests and specifications for specific transformer and inductor groups [Go to Page]
- 4.1.2 Measurement uncertainty
- 4.1.3 Alternative test methods
- 4.2 Visual inspection [Go to Page]
- 4.2.1 General
- 4.2.2 Safety screen position
- 4.2.3 Quality of joints
- Figure 2 – Examples of good solder joints
- Figure 3 – Examples of defective joints
- 4.3 Dimensioning and gauging procedure
- 4.4 Electrical test procedures [Go to Page]
- 4.4.1 Winding resistance
- 4.4.2 Insulation tests
- Table 2 – Voltage of dielectric withstanding voltage test [Go to Page]
- 4.4.3 Losses
- Figure 4 – No-load current test schematic
- Figure 5 – No-load loss test schematic
- Figure 6 – Simplified diagram for short-circuit power test [Go to Page]
- 4.4.4 Inductance
- 4.4.5 Unbalance
- Figure 7 – Circuit for measuring capacitance unbalance
- Figure 8 – Circuit for determining common mode rejection ratio
- Figure 9 – Circuit for measuring impedance unbalance
- Figure 10 – Circuit for determining cross-talk attenuation [Go to Page]
- 4.4.6 Capacitance
- Figure 11 – Schematic diagram of phase unbalance and amplitude unbalance
- Figure 12 – Typical graph for determining self-capacitance [Go to Page]
- 4.4.7 Transformation ratios
- Figure 13 – Circuit for determining inter-winding capacitance
- Figure 14 – Circuit for measurement of voltage transformation ratio
- Figure 15 – Circuit for measuring current transformation ratio and phase displacement
- Figure 16 – Measuring circuit of current transformation ratio and phase displacement [Go to Page]
- 4.4.8 Resonant frequency
- Figure 17 – Circuit for determining parallel self-resonant frequency [Go to Page]
- 4.4.9 Signal transfer characteristics
- Figure 18 – Circuit for determining resonant frequency of resonant assemblies
- Figure 19 – Circuit for determination of insertion loss
- Figure 20 – Use of two identical transformers when the transformation ratio is not unity and/or a DC bias is required
- Figure 21 – Illustration of return loss [Go to Page]
- 4.4.10 Cross-talk
- Figure 22 – Basic return loss test circuit [Go to Page]
- 4.4.11 Frequency response
- Figure 23 – Circuit diagram for measuring the crossover interference between two transformer coils [Go to Page]
- 4.4.12 Pulse characteristics
- 4.4.13 Voltage-time product rating
- Figure 24 – Impulse waveform measuring circuit [Go to Page]
- 4.4.14 Total harmonic distortion
- Figure 25 – Non-linearity of magnetizing current [Go to Page]
- 4.4.15 Voltage regulation
- Figure 26 – Voltage regulation test schematic [Go to Page]
- 4.4.16 Temperature rise
- 4.4.17 Surface temperature
- 4.4.18 Polarity
- Figure 27 – Phase (polarity) test using voltage measurement
- Figure 28 – Series connection method [Go to Page]
- 4.4.19 Screens
- 4.4.20 Noise
- Table 3 – Sound-level corrections for audible noise tests [Go to Page]
- 4.4.21 Corona tests
- 4.4.22 Magnetic fields
- Figure 29 – Helmholtz structure
- Table 4 – Cube dimensions, together with corresponding search coil data [Go to Page]
- 4.4.23 Inrush current
- 4.5 Environmental test procedures [Go to Page]
- 4.5.1 General
- 4.5.2 Soldering
- 4.5.3 Robustness of terminations and integral mounting devices
- 4.5.4 Shock
- 4.5.5 Bump
- 4.5.6 Vibration (sinusoidal)
- 4.5.7 Acceleration, steady state
- 4.5.8 Rapid change of temperature (thermal shock in air)
- 4.5.9 Sealing
- 4.5.10 Climatic sequence
- 4.5.11 Damp heat, steady state
- 4.5.12 Dry heat
- 4.5.13 Mould growth
- 4.5.14 Salt mist, cyclic (sodium chloride solution)
- 4.5.15 Sulphur dioxide test for contacts and connections
- 4.5.16 Fire hazard
- 4.5.17 Immersion in cleaning solvents
- 4.6 Endurance test procedures [Go to Page]
- 4.6.1 Short-term endurance (load run)
- 4.6.2 Long-term endurance (life test)
- Annex A (normative)DC resistance test [Go to Page]
- A.1 General
- A.2 Resistance values under 1 Ω – Kelvin double-bridge method
- Figure A.1 – Measurement of low resistance
- A.3 Resistance values from 1 Ω to many kilo-ohms [Go to Page]
- A.3.1 General
- A.3.2 Ammeter and voltmeter method
- Figure A.2 – Kelvin double-bridge method of measuring low resistance [Go to Page]
- A.3.3 Substitution method
- Figure A.3 – Ammeter and voltmeter method of resistance measurement [Go to Page]
- A.3.4 Wheatstone bridge
- Figure A.4 – Measurement of resistance by substitution
- Figure A.5 – Connections of Wheatstone bridge [Go to Page]
- A.3.5 Ohmmeter
- Figure A.6 – Principle of series ohmmeter
- A.4 Digital ohmmeter – Resistance values from under 1 Ω to many kilo-ohms
- Figure A.7 – Digital ohmmeter method of resistance measurement
- Annex B (normative)Dielectric voltage withstand test [Go to Page]
- Figure B.1– Typical high-potential test, showing section 1 under test
- Figure B.2– Typical high-potential test of inductor
- Annex C (normative)Induced voltage test [Go to Page]
- C.1 Induced voltage test
- C.2 General test conditions
- C.3 General test methods
- Figure C.1 – Block diagram of induced voltage surge test
- C.4 Induced excitation voltage and frequency
- C.5 Repeated induced voltage testing
- C.6 Excitation current
- Annex D (normative)No-load loss [Go to Page]
- D.1 General
- D.2 Excitation waveform [Go to Page]
- D.2.1 General
- D.2.2 Sine-voltage (sine-flux) excitation
- D.2.3 Sine-current excitation
- D.2.4 Square-wave voltage excitation
- D.3 Test method and instrumentation [Go to Page]
- D.3.1 General
- D.3.2 Wattmeter
- Figure D.1 – Triangular flux-density variation in transformer core
- Figure D.2 – Test circuit for transformer no-load losses [Go to Page]
- D.3.3 Ammeters
- D.3.4 Voltmeters
- D.4 Test specifications and results
- Annex E (normative)Quality factor, Q [Go to Page]
- E.1 General
- E.2 Accuracy
- E.3 Generators [Go to Page]
- E.3.1 Signal generator
- E.3.2 Pulse generator
- E.3.3 Antenna
- Figure E.1 – Damped oscillation method
- E.4 Capacitor
- E.5 Measuring circuit [Go to Page]
- E.5.1 Oscilloscope
- E.5.2 Probe
- E.6 Measuring procedure
- E.7 Calculation
- Figure E.2 – Oscilloscope sweep for damped oscillation method
- Annex F (normative)Electrostatic shielding [Go to Page]
- F.1 Symbols
- Figure F.1 – Shielded single winding, core floating
- Figure F.2 – Basic electrostatic symbol
- Figure F.3 – Multiple-shielded single winding, core terminal (lead) provided
- Figure F.4 – Shielded two-winding secondary, core grounded
- Figure F.5 – Shielded group of windings, core floating
- Figure F.6 – Multiple-shielded group of windings, core terminal (lead) provided
- F.2 Theoretical discussion
- Figure F.7 – Combination of shielding conditions
- Figure F.8 – Typical two-winding shielded transformer
- Figure F.9 – Simplified representation of Figure F.8
- F.3 Measurement methods [Go to Page]
- F.3.1 Indirect method
- Figure F.10 – Indirect measuring method for electrostatic shielding [Go to Page]
- F.3.2 Direct method
- Annex G (normative)Corona test [Go to Page]
- G.1 Detection of corona
- G.2 Analysis of corona
- Figure G.1 – Typical circuit for corona measurement (circuit 1)
- G.3 Test conditions and specifications
- Figure G.2 – Typical circuit for corona measurement (circuit 2)
- Bibliography [Go to Page]
