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eLibrary > BS IEC 62529:2024, IEEE Std 1641™-2022 Standard for Signal and Test Definition >

BS IEC 62529:2024, IEEE Std 1641™-2022 Standard for Signal and Test Definition, 2024

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BS IEC 62529:2024, IEEE Std 1641™-2022 Standard for Signal and Test Definition, 2024

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CONTENTS
FOREWORD
Important Notices and Disclaimers Concerning IEEE Standards Documents
Introduction
1. Overview [Go to Page]
1.1 Scope
1.2 Purpose
1.3 Word Usage
1.4 Application
1.5 Annexes
2. Definitions, abbreviations, and acronyms [Go to Page]
2.1 Definitions
2.2 Abbreviations and acronyms
3. Structure of this standard [Go to Page]
3.1 Layers
3.2 Signal Modeling Language (SML) layer
3.3 BSC layer
3.4 TSF layer
3.5 Test requirement layer
3.6 Using the layers
4. Signals and SignalFunctions [Go to Page]
4.1 Introduction
4.2 Physical signal states
4.3 Event states
4.4 Digital stream states
5. SML layer
6. BSC layer [Go to Page]
6.1 BSC layer base classes
6.2 General description of BSCs
6.3 SignalFunction template
7. TSF layer [Go to Page]
7.1 TSF classes
7.2 TSF signals defined by a model
7.3 TSF signals defined by an external reference
8. Test procedure language (TPL) [Go to Page]
8.1 Goals of the TPL
8.2 Elements of the TPL
8.3 Use of the TPL
9. Maximizing test platform independence
Annexes [Go to Page]
Annex A (normative) Signal modeling language (SML) [Go to Page]
A.1 Use of the SML
A.2 Introduction
A.3 Physical types
A.4 Signal definitions
A.5 Pure signals
A.6 Pure signal-combining mechanisms
A.7 Pure function transformations
A.8 Measure, limiting, and sampling signals
A.9 Digital signals
A.10 Basic component SML
A.11 Fast Fourier analysis support
Annex B (normative) Basic signal components (BSC) layer [Go to Page]
B.1 BSC layer base classes
B.2 BSC subclasses
B.3 Description of a BSC
B.4 Physical class
B.5 PulseDefns class
B.6 SignalFunction class
Annex C (normative) Dynamic signal descriptions [Go to Page]
C.1 Introduction
C.2 Basic classes
C.3 Dynamic signal goals and use cases
Annex D (normative) Interface definition language (IDL) basic components [Go to Page]
D.1 Introduction
D.2 IDL BSC library
Annex E (informative)Test signal framework (TSF) for C/ATLAS [Go to Page]
E.1 Introduction
E.2 TSF library definition in extensible markup language (XML)
E.3 Interface definition language (IDL) for the TSF for C/ATLAS
E.4 AC_SIGNAL
E.5 AM_SIGNAL
E.6 DC_SIGNAL
E.7 DIGITAL_PARALLEL
E.8 DIGITAL_SERIAL
E.9 DIGITAL_TEST
E.10 DME_INTERROGATION
E.11 DME_RESPONSE
E.12 FM_SIGNAL
E.13 ILS_GLIDE_SLOPE
E.14 ILS_LOCALIZER
E.15 ILS_MARKER
E.16 PM_SIGNAL
E.17 PULSED_AC_SIGNAL
E.18 PULSED_AC_TRAIN
E.19 PULSED_DC_SIGNAL
E.20 PULSED_DC_TRAIN
E.21 RADAR_RX_SIGNAL
E.22 RADAR_TX_SIGNAL
E.23 RAMP_SIGNAL
E.24 RANDOM_NOISE
E.25 RESOLVER
E.26 RS_232
E.27 SQUARE_WAVE
E.28 SSR_INTERROGATION
E.29 SSR_RESPONSE
E.30 STEP_SIGNAL
E.31 SUP_CAR_SIGNAL
E.32 SYNCHRO
E.33 TACAN
E.34 TRIANGULAR_WAVE_SIGNAL
E.35 VOR
Annex F (informative) Test signal framework (TSF) library for digital pulse classes [Go to Page]
F.1 Introduction
F.2 TSF library definition in extensible markup language (XML)
F.3 Graphical models of TSFs
F.4 Pulse class family of TSFs
F.5 DTIF
Annex G (normative) Carrier language requirements [Go to Page]
G.1 Carrier language requirements
G.2 Interface definition language (IDL)
G.3 Datatypes
Annex H (normative) Test procedure language (TPL) [Go to Page]
H.1 TPL layer
H.2 Elements of the TPL
H.3 Structure of test requirements
H.4 Carrier language
H.5 Signal statements
H.6 Mapping of test statements to carrier language
H.7 Test statement definitions
H.8 Elements used in test statement definitions
H.9 Attributes with multiple properties
H.10 Transferring data in digital signals
H.11 Creating test requirements
H.12 Delimiting TPL statements
Annex I (normative) Extensible markup language (XML) signal descriptions [Go to Page]
I.1 Introduction
I.2 XSD for BSCs
I.3 XSD for TSFs
Annex J (informative) Support for ATLAS nouns and modifiers [Go to Page]
J.1 Signal and test definition (STD) support for ATLAS signals
J.2 STD support for ATLAS nouns
J.3 STD support for C/ATLAS noun modifiers
J.4 Support for C/ATLAS extensions
Annex K (informative) Guide for maximizing test platform independence [Go to Page]
K.1 Introduction
K.2 Guiding principles
K.3 Best practice rules
Annex L (informative) IEEE download web-site material associated with this document
Annex M (informative) Bibliography
Participants [Go to Page]

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