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IEEE Standard for Reduced-Pin and Enhanced-Functionality Test Access Port and Boundary-Scan Architecture (Redline), 2022

This document is reproduced and distributed under license from The Institute of Electrical and Electronics Engineers, Incorporated (IEEE), 445 Hoes Lane, Piscataway, New Jersey 08854 and is protected by United States and international copyright laws and treaties. No part of this publication may be reproduced, in any form and in any medium, without the prior written consent of the IEEE. If you have any questions, please contact MADCAD.com at support@madcad.com or call at 1.800.798.9296.
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IEEE Standard for Reduced-Pin and Enhanced-Functionality Test Access Port and Boundary-Scan Architecture (Redline), 2022