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16/30350429 DC BS EN 61000-4-20. Electromagnetic compatibility (EMC). Part 4-20. Testing and measurement techniques. Emission and immunity testing in transverse electromagnetic (TEM) waveguides, 2019
- 77B_766e_CD.pdf [Go to Page]
- 1 Scope and object
- 2 Normative references
- 3 Terms, definitions and abbreviations [Go to Page]
- 3.1 Terms and definitions
- 3.2 Abbreviations
- 4 General
- 5 TEM waveguide requirements [Go to Page]
- 5.1 General
- 5.2 General requirements for the use of TEM waveguides [Go to Page]
- 5.2.1 Test volume and maximum EUT size
- 5.2.2 Validation of usable test volume [Go to Page]
- 5.2.2.1 General considerations
- 5.2.2.2 Field uniformity verification [Go to Page]
- 5.2.2.2.1 Constant forward power method
- 5.2.2.2.2 Constant field strength method
- 5.2.2.3 TEM mode verification
- 5.2.2.4 Field uniformity and TEM mode measurement procedure [Go to Page]
- 5.2.2.4.1 Constant forward power method
- 5.2.2.4.2 Constant field strength method
- 5.3 Special requirements and recommendations for certain types of TEM waveguides [Go to Page]
- 5.3.1 Set-up of open TEM waveguides
- 5.3.2 Alternative TEM mode verification for a two-port TEM waveguide
- 5.3.3 TEM mode generation for a four-port TEM waveguide
- 6 Overview of EUT types [Go to Page]
- 6.1 General
- 6.2 Small EUT
- 6.3 Large EUT
- 7 Laboratory test conditions [Go to Page]
- 7.1 General
- 7.2 Climatic conditions
- 7.3 Electromagnetic conditions
- 8 Evaluation and reporting of test results
- Annex A (normative) Emission testing in TEM waveguides [Go to Page]
- A.1 Overview
- A.2 Test equipment
- A.3 Correlating TEM waveguide voltages to E-field data [Go to Page]
- A.3.1 General remarks
- A.3.2 Correlation algorithms [Go to Page]
- A.3.2.1 General
- A.3.2.2 Multipole model
- A.3.2.3 One-port TEM waveguide correlation algorithm [Go to Page]
- A.3.2.3.1 General
- A.3.2.3.2 TEM waveguide voltage measurements
- A.3.2.3.3 Determining the field factor [Go to Page]
- General
- Experimental procedure
- Analytical procedure
- A.3.2.4 Correlation to OATS
- A.4 Emission test correction factors [Go to Page]
- A.4.1 Reference emission sources
- A.4.2 Arrangement of small EUTs
- A.4.3 Calculation of the small EUT correction factor
- A.5 Emission test procedures in TEM waveguides [Go to Page]
- A.5.1 EUT types [Go to Page]
- A.5.1.1 Small EUTs
- A.5.1.2 Large EUTs
- A.5.1.3 Large EUTs may be tested using 12 orientations, as depicted in Figure A.4. For each EUT orientation, exit cables shall be aligned as closely as possible with the primary TEM mode electric field component (e.g., the y-axis in Fig. D.7) until th...
- A.5.2 EUT arrangement
- A.6 Test report
- Annex B (normative) Immunity testing in TEM waveguides [Go to Page]
- B.1 Overview
- B.2 Test equipment [Go to Page]
- B.2.1 General
- B.2.2 Description of the test facility
- B.3 Field uniformity area calibration
- B.4 Test levels
- B.5 Test set-up [Go to Page]
- B.5.1 Arrangement of table-top equipment
- B.5.2 Arrangement of floor-standing equipment
- B.5.3 Arrangement of wiring
- B.6 Test procedures
- B.7 Test results and test report
- Annex C (normative) HEMP transient testing in TEM waveguides [Go to Page]
- C.1 Overview
- C.2 Immunity tests [Go to Page]
- C.2.1 General
- C.2.2 Radiated test facilities
- C.2.3 Frequency domain spectrum requirements
- C.3 Test equipment
- C.4 Test set-up
- C.5 Test procedure [Go to Page]
- C.5.1 General
- C.5.2 Severity level and test exposures
- C.5.3 Test procedure [Go to Page]
- C.5.3.1 Test parameter measurements
- C.5.3.2 Radiated test procedure
- C.5.3.3 Small radiated test facility
- C.5.4 Test execution
- C.5.5 Execution of the radiated immunity test
- Annex D (informative) TEM waveguide characterization [Go to Page]
- D.1 Overview
- D.2 Distinction between wave impedance and characteristic impedance
- D.3 TEM wave [Go to Page]
- D.3.1 General
- D.3.2 Free-space TEM mode
- D.3.3 Waveguide
- D.4 Wave propagation [Go to Page]
- D.4.1 General
- D.4.2 Spherical propagation
- D.4.3 Plane wave propagation in free space
- D.4.4 Velocity of propagation
- D.5 Polarization [Go to Page]
- D.5.1 Polarization vector
- D.5.2 Linear and elliptic polarization
- D.6 Types of TEM waveguides [Go to Page]
- D.6.1 General
- D.6.2 Open TEM waveguides (striplines, etc.)
- D.6.3 Closed TEM waveguides (TEM cells)
- D.7 Frequency limitations
- Annex E (informative) Calibration method for E-field probes in TEM waveguides [Go to Page]
- E.1 Overview
- E.2 Probe calibration requirements [Go to Page]
- E.2.1 General
- E.2.2 Calibration frequency range
- E.2.3 Calibration volume
- E.2.4 Probe dimensions
- E.2.5 Perturbations of a TEM waveguide due to probe
- E.2.6 Frequency steps
- E.2.7 Field strength
- E.3 Requirements for calibration instrumentation [Go to Page]
- E.3.1 Specifications of TEM waveguide
- E.3.2 Harmonics and spurious signals
- E.3.3 Probe fixture
- E.3.4 Measuring net power to a transmitting device using directional couplers
- E.4 Field probe calibration [Go to Page]
- E.4.1 Calibration methods
- E.4.2 Calibration procedure in a case of two-port TEM waveguide
- E.4.3 Calibration procedure in a case of one-port TEM waveguide [Go to Page]
- E.4.3.1 Transfer method
- E.4.3.2 Method of electric field estimation at the calibration position
- E.4.3.3 Calculation of antenna factor from antenna impedance using equivalent length
- Annex F (informative) Measurement uncertainty of emission measurements [Go to Page]
- F.3.2 Rationale for the estimates of input quantities for radiated disturbance measurements using a TEM waveguide
- Annex G (informative) Measurement uncertainty of immunity testing due to test instrumentation [Go to Page]
- G.1 General symbols
- G.2 Symbol and definition of the measurand
- G.3 Symbols for input quantities
- G.4 Example: Uncertainty budget for immunity test
- G.5 Rationale for the estimates of input quantities
- Annex H (informative) Correlation of Emission and Immunity Limits Between EMC Test Facilities [Go to Page]
- E.5 H.1 Introduction
- E.6 H.2 Dipole in free space
- E.7 H.3 Dipole in half space
- E.8 H.4 Dipole in a TEM transmission line
- E.9 H.5 Dipole in a reverberation chamber
- E.10 H.6 Correlation
- E.11 H.7 Example Emission Limits
- Annex I (informative) Transient TEM waveguide characterization [Go to Page]
- [10] N. Briest, S. Potthast, H. Garbe, “Transmission Characteristics of a TEM Waveguide for Transient Signals by the use of a Damped Sinusoidal”, Adv. Radio Sci., 13, 2015, 175-179
- [11] N. Briest, H. Garbe, D. Hamann and S. Potthast, “Extension of the IEC 61000-4-20 Annex C to the Use of Arbitrary Transient Signals,” Proc. IEEE Int. Symp. EMC., 2016. 829–834 [Go to Page]
