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20/30400273 DC BS EN IEC 60691. Thermal-links. Requirements and application guide, 2020
- 32C_579e_CD.pdf [Go to Page]
- CONTENTS
- FOREWORD
- INTRODUCTION
- 1 Scope
- 2 Normative references
- 3 Terms and definitions
- 4 General requirements
- 5 General notes on tests
- 6 Classification [Go to Page]
- 6.1 Electrical conditions
- 6.2 Thermal conditions
- 6.3 Resistance to tracking
- 7 Marking
- 8 Documentation
- 9 Constructional requirements [Go to Page]
- 9.1 General
- 9.2 Lead secureness tests [Go to Page]
- 9.2.1 General
- 9.2.2 Tensile test
- 9.2.3 Thrust test
- 9.2.4 Bending/twist test
- 9.3 Contacts used for the current path
- 9.4 Accessible mounting brackets or metal parts
- 9.5 Insulating materials
- 9.6 Resistance to tracking
- 9.7 Creepage distances and clearances
- 9.8 Temperature and humidity cycle conditioning
- 9.9 Terminals and terminations
- 10 Electrical requirements [Go to Page]
- 10.1 Dielectric strength
- 10.2 Insulation resistance
- 10.3 Interrupting current [Go to Page]
- 10.3.1 General
- 10.3.2 Specific conditions [Go to Page]
- 10.3.2.1 Any noncurrent-carrying metal part that is an inherent part of the thermal assembly and that may be bonded electrically to a normally-earthed exposed part of the end-product shall be connected through a quick acting and high breaking 1 A fuse...
- 10.3.2.2 For a thermal-link having an exposed element, a metal screen shall be located 12,7 mm away from live parts. The screen shall be connected to the opposite pole of the test circuit through a quick acting and high breaking 1 A fuse (see IEC 6012...
- 10.3.2.3 Based on the intended use of a thermal-link, the screen may be located at a distance other than 12,7 mm if acceptable to both the manufacturer and the end user.
- 10.3.2.4 The test circuit shall have an open circuit voltage within 1,1 to 1,155 times the rated voltage of the thermal-link to be tested. This tolerance may be exceeded with the manufacture's consent. The closed circuit voltage of the test circuit wh...
- 10.3.2.5 The tolerance of the test current shall be within 2,5 % of the specified test current.
- 10.3.2.6 If a thermal-link has the same current rating at more than one voltage, a test at the highest voltage is considered to be representative of tests at the lower voltages.
- 10.3.2.7 If a thermal-link has more than one voltage rating within a specific power factor group, the tests shall cover the conditions of maximum voltage, power, and current. One test may cover two of these conditions.
- 10.3.2.8 For thermal-links assigned a pilot duty rating, the test load shall consist of an electromagnet representative of the magnet coil load that the thermal-link is intended to control. The test current shall be the normal current which shall be d...
- 10.3.2.9 Compliance is checked by the following test.
- 10.3.2.10 The oven temperature may be monitored by means of a thermocouple attached to an identical but non-functioning thermal-link mounted adjacent to the samples under test.
- 10.3.2.11 A thermal-link that is rated for controlling an alternating-current motor is acceptable for alternating current pilot duty without further interrupting current tests if, during the original interrupting current test, the power factor was 0,5...
- 10.3.2.12 There shall be no damage to the integral leads of a thermal-link. There shall be no emission of hazardous substances from a thermal-link. The case of an enclosed element shall remain intact. The quick acting and high breaking 1 A fuse (see I...
- 10.3.2.13 After these tests, the insulation resistance shall comply with the requirements of 10.2.
- 10.4 Transient overload current
- 10.5 Limited short-circuit test [Go to Page]
- 10.5.1 General [Go to Page]
- 10.5.1.1 When declared by a manufacturer, a thermal-link is tested as described in 10.5.2 and 10.5.3.
- 10.5.1.2 If the limited short-circuit test is conducted on the thermal-link itself with acceptable results, the test need not be repeated during the investigation of the end-product.
- 10.5.2 Test method [Go to Page]
- 10.5.2.1 Three samples of the thermal-link shall be subjected to a limited short-circuit test.
- 10.5.2.2 The test shall be conducted at a voltage within (5 % tolerance of the rated voltage Ur.
- 10.5.2.3 The thermal-link shall be connected in series with a non-renewable fuse properly selected for the application in accordance with 10.5.3. The circuit shall limit the current to the applicable value specified in Table 6, measured without the th...
- 10.5.2.4 The power factor of the circuit shall be 0,9 to 1,0, unless a lower power factor is acceptable to both the manufacturer and the end user.
- 10.5.2.5 The thermal-link shall be connected in the circuit by two 915 mm lengths of copper wire having a cross-sectional area as indicated in Table 6 of IEC 60730-1:2013. Cotton shall surround the thermal-link, or a metal screen located 50 mm away – ...
- 10.5.2.6 Each thermal-link shall be subjected to one test.
- 10.5.3 Fuse size (rating)
- 10.5.4 Compliance
- 11 Temperature tests [Go to Page]
- 11.1 General
- 11.2 Holding temperature, Th
- 11.3 Rated functioning temperature, Tf
- 11.4 Maximum temperature limit, Tm
- 11.5 Ageing [Go to Page]
- 11.5.4.1 Step 1If requested by the manufacturer, the specimens are subjected to a temperature chosen between Tf ( 15 K and Th for a period of three weeks. At the conclusion of the test, at least 50 % of the specimens shall not have functioned.
- 11.5.4.2 The following tests are mandatory:
- 12 Resistance to rusting
- 13 Manufacturer’s validation programme
- Annex A (normative) Application guide
- Annex B (normative) Alternative ageing test for thermal-links with Th greater than 250 C for use in electric irons
- Annex C (normative) Conductive heat ageing test [Go to Page]
- C.1 Conductive heat ageing test
- C.2 Method [Go to Page]
- C.2.1 General
- C.2.2 Typical test fixture assembly
- C.2.3 Temperature setting
- C.2.4 Temperature behaviour
- C.2.5 Temperature monitoring
- C.3 Ageing [Go to Page]
- C.3.1 General
- C.3.2 Cooling operation
- C.3.3 Premature operation
- C.4 Results
- C.5 Dielectric strength test
- C.6 Test oven
- Annex D (informative) Extended holding temperature evaluation [Go to Page]
- D.1 Extended holding temperature conditioning test
- D.2 Load current interrupt test
- Annex E (normative) Seal ageing test
- Annex F (normative) Identification requirements
- Annex G (normative) Indelibility of markings0F
- Annex H (normative) Requirements for thermal-link packaged assemblies
- H.3 Terms and definitions
- H.4 General requirements
- H.5 General notes on tests
- H.9 Constructional requirements [Go to Page]
- H.9.5 Insulating materials
- H.9.9 Terminals and terminations
- H.11. 101 Maximum use temperature test
- Annex I (informative) Holding temperature
- Bibliography [Go to Page]
