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eLibrary > 24/30485839 DC BS EN IEC 61987-41 IEC 61987 - Part 41: Generic structures of List of Properties (LOP) of Process Analyzer Technology (PAT) measuring devices for electronic data exchange >

24/30485839 DC BS EN IEC 61987-41 IEC 61987 - Part 41: Generic structures of List of Properties (LOP) of Process Analyzer Technology (PAT) measuring devices for electronic data exchange, 2024

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24/30485839 DC BS EN IEC 61987-41 IEC 61987 - Part 41: Generic structures of List of Properties (LOP) of Process Analyzer Technology (PAT) measuring devices for electronic data exchange, 2024

65E_1067e_CDV.pdf [Go to Page]
FOREWORD
INTRODUCTION
1 Scope
2 Normative references
3 Terms and definitions [Go to Page]
3.1 Dynamic property
3.2 List of Properties for Dynamic Data (LOPD)
4 General [Go to Page]
4.1 Characterization scheme
4.2 OLOP, DLOP and LOPD
4.3 Cardinality and polymorphism
5 Operating List of Properties (OLOP) [Go to Page]
5.1 Generic block structure
5.2 Matrix of components/measurands [Go to Page]
5.2.1 Chemical component/measurand [Go to Page]
5.2.1.1 Process analyser measurands
5.3 Measuring or control point
5.4 Base conditions
5.5 Physical properties at sampling point
5.6 Operating conditions for device design
5.7 Process equipment
5.8 Physical location [Go to Page]
5.8.1 General
5.8.2 Available power supply
5.8.3 Purge gas supply
5.8.4 Process criticality classification
5.8.5 Area classification
5.9 Auxiliary media
6 Device List of Properties (DLOP) [Go to Page]
6.1 Basic structure [Go to Page]
6.1.1 General
6.1.2 Generic block structure
6.1.3 Relationship to IEC 61987-10F
7 LOPD with dynamic properties for condition monitoring [Go to Page]
7.1 General
7.2 Measurement variables
7.3 General device variables/status
7.4 Specific device variables/status/condition monitoring
7.5 General device parameters and variables
7.6 General functions
8 Additional aspects
Annex A (informative) Device Type Dictionary – Classification of process analysers
Bibliography [Go to Page]

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24/30485839 DC BS EN IEC 61987-41 IEC 61987 - Part 41: Generic structures of List of Properties (LOP) of Process Analyzer Technology (PAT) measuring devices for electronic data exchange, 2024

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