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eLibrary > 24/30505492 DC BS EN IEC 62047-51 Semiconductor Devices - Micro-electromechanical Devices - Part 51: Test method of electrical characteristics under two-directional cyclic bending deformation for flexible microelectromechanical devices >

24/30505492 DC BS EN IEC 62047-51 Semiconductor Devices - Micro-electromechanical Devices - Part 51: Test method of electrical characteristics under two-directional cyclic bending deformation for flexible microelectromechanical devices, 2024

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