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eLibrary >
BS EN IEC 55015:2019 Limits and methods of measurement of radio disturbance characteristics of electrical lighting and similar equipment >
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BS EN IEC 55015:2019 Limits and methods of measurement of radio disturbance characteristics of electrical lighting and similar equipment, 2019
- National foreword [Go to Page]
- Annex ZA(normative)Normative references to international publicationswith their corresponding European publications
- English [Go to Page]
- CONTENTS
- FOREWORD
- 1 Scope
- 2 Normative references
- 3 Terms, definitions and abbreviated terms [Go to Page]
- 3.1 General
- 3.2 General terms and definitions
- 3.3 Terms and definitions related to equipment
- 3.4 Terms and definitions related to interfaces and ports
- 3.5 Abbreviated terms
- Figures [Go to Page]
- Figure 1 – EMC-ports of an EUT
- 4 Limits [Go to Page]
- 4.1 General
- 4.2 Frequency ranges
- Figure 2 – Generic depiction of the definitions of test-, ancillary-, auxiliary- and associated equipment w.r.t. EUT and the test/measurement environment(definitions given in CISPR 16-2-3)
- 4.3 Limits and methods for the assessment of wired network ports [Go to Page]
- 4.3.1 Electric power supply interface
- 4.3.2 Wired network interfaces other than power supply
- Tables [Go to Page]
- Table 1 – Disturbance voltage limits at the electric power supply interface
- Table 2 – Disturbance voltage limits at wired network interfaces other than power supply
- 4.4 Limits and methods for the assessment of local wired ports
- Table 3 – Disturbance current limits at wired network interfaces other than power supply
- Table 4 – Disturbance voltage limits of local wired ports: electrical power supply interface of non-restricted ELV lamps
- 4.5 Limits and methods for the assessment of the enclosure port [Go to Page]
- 4.5.1 General
- 4.5.2 Frequency range 9 kHz to 30 MHz
- Table 5 – Disturbance voltage limits at local wired ports: local wired ports other than electrical power supply interface of ELV lamp
- Table 6 – Disturbance current limits at local wired ports: local wired ports other than electrical power supply interface of ELV lamp [Go to Page]
- 4.5.3 Frequency range 30 MHz to 1 GHz
- Table 7 – Maximum EUT dimension that can be usedfor testing using LLAS with different diameters
- Table 8 – LLAS radiated disturbance limits in the frequency range 9 kHz to 30 MHz
- Table 9 – Loop antenna radiated disturbance limits in the frequency range 9 kHz to 30 MHz for equipment with a dimension > 1,6 m
- 5 Application of the limits [Go to Page]
- 5.1 General
- 5.2 Identification of the interfaces subject to test
- Table 10 – Radiated disturbance limits and associated measurement methodsin the frequency range 30 MHz to 1 GHz
- 5.3 Application of limits to the interfaces [Go to Page]
- 5.3.1 General
- 5.3.2 Conducted disturbance requirements for the wired network port
- 5.3.3 Conducted disturbance requirements for local wired ports
- 5.3.4 Radiated disturbance requirements for the enclosure port
- 5.3.5 Multiple interfaces of the same type
- 5.3.6 Interfaces that can be categorised as multiple types of ports
- 6 Product specific limit application requirements [Go to Page]
- 6.1 General
- 6.2 Passive EUT
- 6.3 Rope lights [Go to Page]
- 6.3.1 General
- 6.3.2 Requirements for rope lights
- 6.4 Modules [Go to Page]
- 6.4.1 General
- 6.4.2 Modules having multiple applications
- 6.4.3 Internal modules
- 6.4.4 External modules
- 6.4.5 Single capped self-ballasted lamps
- 6.4.6 Double-capped self-ballasted lamps, double-capped lamp adapters, double-capped semi-luminaires and double-capped retrofit lamps used in fluorescent lamp luminaires
- 6.4.7 ELV lamps
- 6.4.8 Single-capped semi-luminaires
- 6.4.9 Independent igniters
- 6.4.10 Replaceable starters for fluorescent lamps
- 7 Operating and test conditions of the EUT [Go to Page]
- 7.1 General
- 7.2 Switching
- 7.3 Supply voltage and frequency
- 7.4 Rated lamp load and light regulation
- 7.5 Operating modes
- 7.6 Ambient conditions
- 7.7 Lamps [Go to Page]
- 7.7.1 Type of lamps used in lighting equipment
- 7.7.2 Ageing times
- 7.8 Stabilization times
- 7.9 Operation and loading of wired interfaces [Go to Page]
- 7.9.1 General
- 7.9.2 Interface intended for a continuous signal or data transmission
- 7.9.3 Interface not intended for a continuous signal or data transmission
- 7.9.4 Load
- 8 Methods of measurement of conducted disturbances [Go to Page]
- 8.1 General
- 8.2 Measurement instrumentation and methods
- 8.3 Electrical power supply interface disturbance measurement
- 8.4 Disturbance measurement of wired network interfaces other than power supply
- Table 11 – Overview of standardized conducted disturbance measurement methods
- 8.5 Local wired port disturbance measurement [Go to Page]
- 8.5.1 Electrical power supply of ELV lamps
- 8.5.2 Other than electrical power supply of ELV lamps
- 9 Methods of measurement of radiated disturbances [Go to Page]
- 9.1 General
- 9.2 Intentional wireless transmitters
- 9.3 Measurement instrumentation and methods [Go to Page]
- 9.3.1 General
- 9.3.2 LLAS radiated disturbance measurement 9 kHz to 30 MHz
- Table 12 – Overview of standardized radiated disturbance measurement methods [Go to Page]
- 9.3.3 Loop antenna radiated disturbance measurement 9 kHz to 30 MHz
- 9.3.4 Radiated disturbance measurement 30 MHz to 1 GHz
- 10 Compliance with this document
- 11 Measurement uncertainty
- 12 Test report [Go to Page]
- Figure 3 – EUT and its physical interfaces
- Figure 4 – Decision process on the application of limits to the EUT
- Figure 5 – Example of a host system with different types of modules
- Annexes [Go to Page]
- Annex A (normative) Product specific application notes referring to particular measurement set-ups or operating conditions [Go to Page]
- A.1 Single-capped self-ballasted lamps [Go to Page]
- A.1.1 Arrangement for conducted disturbance measurements
- A.1.2 Arrangement for radiated disturbance measurements
- A.2 Semi-luminaires
- A.3 Rope lights [Go to Page]
- A.3.1 Preparation of the EUT
- A.3.2 Arrangement for conducted disturbance measurements
- A.3.3 Arrangement for radiated disturbance measurements
- A.4 Double-capped lamp adapters, double-capped self-ballasted lamps, double-capped semi-luminaires and double-capped retrofit lamps used in fluorescent lamp luminaires [Go to Page]
- A.4.1 For application in linear luminaires with electromagnetic controlgear
- A.4.2 For application in linear luminaires with electronic controlgear
- A.4.3 For application in other than linear luminaires
- A.4.4 Measurement methods
- A.5 ELV lamps [Go to Page]
- A.5.1 Conducted disturbance test
- A.5.2 Radiated disturbance tests
- A.6 Independent igniters
- Figure A.1 – Reference luminaire for double-capped lamp adapter, double-capped self-ballasted lamp, double-capped semi-luminaire and double-capped retrofit lamp used in linear fluorescent lamp luminaires (see A.4.1)
- Figure A.2 – Conical metal housing for single capped lamps (see A.1.1)
- Figure A.3 – Arrangements for conducted disturbance measurements from non-restricted ELV lamps (see A.5.1)
- Figure A.4 – Arrangements for conducted disturbance measurements from restricted ELV lamps (see A.5.1)
- Figure A.5 – Hose-clamp reference luminaire for self-ballasted lamps with a GU10 bayonet cap (see A.1.1)
- Figure A.6 – Support plate for arranging long cablesand rope lights (see 9.3.2, Clauses A.3 and B.3)
- Annex B (normative) Test arrangements for conducted disturbance measurements [Go to Page]
- B.1 General
- B.2 Arrangement of cables connected to interfaces of wired network ports [Go to Page]
- B.2.1 Arrangements of electric power supply cables
- B.2.2 Arrangement of other than electric power supply cables
- B.3 Arrangement of cables connected to interfaces of local wired ports [Go to Page]
- B.3.1 General
- B.3.2 Cables of local-wired ports indirectly connected to a network
- B.3.3 Cables of local-wired ports other than the type mentioned in B.3.2
- B.3.4 Power-supply cables of an ELV lamp
- B.3.5 Arrangement of measurement probes
- B.4 Loading and termination of cables
- B.5 Luminaires
- B.6 Modules
- Figure B.1 – Circuit for measuring conducted disturbances from a luminaire (Figure B.1a), an internal/mounted/replaceable module (Figure B.1b) and a single capped self-ballasted or independent non-gas-discharge lamp Figure B.1c)
- Figure B.2 – Circuit for measuring conducted disturbances from an external module
- Figure B.3 – Measuring arrangements for conducted disturbances (see Clause B.5)
- Annex C (normative) Test arrangements for radiated disturbance measurements [Go to Page]
- C.1 General
- C.2 Arrangements of electric power supply cables
- C.3 Arrangement of cables other than electric power supply cables
- C.4 Arrangements of EUT, auxiliary equipment and associated equipment [Go to Page]
- C.4.1 General
- C.4.2 EUT arrangements for table-top, wall-mounted or ceiling-mounted applications
- C.4.3 EUT arrangements for floor-standing and pole-mounted applications
- C.5 Loading and termination of cables
- Figure C.1 – EUT arrangement of ceiling-, wall-mounted and table-top applications during the radiated (OATS, SAC or FAR) disturbance measurement
- Figure C.2 – EUT arrangement of floor-standing and pole-mounted applications during the radiated (OATS, SAC or FAR) disturbance measurement
- Figure C.3 – Example of arrangement of a luminaire during the radiated (OATS, SAC or FAR) disturbance measurement
- Figure C.4 – Example of arrangement of an internal module during the radiated (OATS, SAC or FAR) disturbance measurement
- Figure C.5 – Example of arrangement of an external module during the radiated (OATS, SAC or FAR) disturbance measurement
- Annex D (informative) Examples of application of limits and test methods [Go to Page]
- D.1 General
- D.2 Case 1: Power controlgear with remote battery connection [Go to Page]
- D.2.1 EUT description
- D.2.2 Interfaces, ports and limits
- Figure D.1 – Case 1 EUT [Go to Page]
- D.3 Case 2: Universal presence and light detector [Go to Page]
- D.3.1 EUT description
- D.3.2 Interfaces, ports and limits
- Table D.1 – Case 1: Summary of interfaces, applicable ports and limits
- Figure D.2 – Case 2 EUT
- Table D.2 – Case 2 – Application 1: Summary of interfaces, applicable ports and limits [Go to Page]
- D.4 Case 3: Driver with three load interfaces [Go to Page]
- D.4.1 EUT description
- D.4.2 Interfaces, ports and limits
- Table D.3 – Case 2 – Application 2: Summary of interfaces, applicable ports and limits
- Figure D.3 – Case 3 EUT
- Table D.4 – Case 3: Summary of interfaces, applicable ports and limits [Go to Page]
- D.5 Case 4: Ethernet powered OLED [Go to Page]
- D.5.1 EUT description
- D.5.2 Interfaces, ports and limits
- D.6 Case 5: Stand-alone occupancy-daylight sensor [Go to Page]
- D.6.1 EUT description
- D.6.2 Interfaces, ports and limits
- Figure D.4 – Case 4 EUT
- Table D.5 – Case 4: Summary of interfaces, applicable ports and limits
- Figure D.5 – Case 5 EUT
- Table D.6 – Case 5: Summary of interfaces, applicable ports and limits
- Annex E (informative) Statistical considerations in the determination of EMC compliance of mass-produced products [Go to Page]
- E.1 General
- E.2 Test method based on a general margin to the limit
- E.3 Test method based on the non-central t-distribution [Go to Page]
- E.3.1 Practical implementation by using frequency sub-ranges
- E.3.2 Frequency sub-ranges
- E.3.3 Data distortion occurring at a sub-range boundary
- Table E.1 – General margin to the limit for statistical evaluation
- Table E.2 – Sample size and corresponding k factor in a non-central t-distribution [Go to Page]
- E.4 Test method based on the binomial distribution
- Figure E.1 – Illustration of difficulties in case the maximum valueof the disturbance is at the boundary of a sub-range
- Table E.3 – Application of the binomial distribution [Go to Page]
- E.5 Application of larger sample size
- Bibliography [Go to Page]
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