Already a subscriber?
MADCAD.com Free Trial
Sign up for a 3 day free trial to explore the MADCAD.com interface, PLUS access the
2009 International Building Code to see how it all works.
If you like to setup a quick demo, let us know at support@madcad.com
or +1 800.798.9296 and we will be happy to schedule a webinar for you.
Security check
Please login to your personal account to use this feature.
Please login to your authorized staff account to use this feature.
Are you sure you want to empty the cart?
BS EN IEC 61280-4-2:2024 Fibre-optic communication subsystem test procedures - Installed cabling plant. Single-mode attenuation and optical return loss measurements, 2024
- undefined [Go to Page]
- Annex ZA (normative)Normative references to international publicationswith their corresponding European publications
- English [Go to Page]
- CONTENTS
- FOREWORD
- INTRODUCTION
- 1 Scope
- 2 Normative references
- 3 Terms, definitions, graphical symbols and abbreviated terms [Go to Page]
- 3.1 Terms and definitions
- 3.2 Graphical symbols
- Figures [Go to Page]
- Figure 1 – Connector symbols
- 3.3 Abbreviated terms
- 4 Measurement methods [Go to Page]
- 4.1 General [Go to Page]
- 4.1.1 Document structure
- Figure 2 – Symbol for cabling under test [Go to Page]
- 4.1.2 Attenuation
- 4.1.3 Optical return loss
- 4.2 Cabling configurations and applicable test methods [Go to Page]
- 4.2.1 Cabling configurations and applicable test methods for attenuation measurements
- Tables [Go to Page]
- Table 1 – Cabling configurations
- Figure 3 – Configuration A – Start and end of measured attenuations in RTM
- Figure 4 – Configuration B – Start and end of measured attenuations in RTM
- Figure 5 – Configuration C – Start and end of measured attenuations in RTM
- Figure 6 – Configuration D – Start and end of measured attenuations in RTM
- Table 2 – Test methods and configurations [Go to Page]
- 4.2.2 Cabling configurations and applicable test methods for optical return loss measurements
- 5 Overview of uncertainties for attenuation measurements [Go to Page]
- 5.1 General
- 5.2 Sources of significant uncertainties
- 5.3 Consideration of the power meter
- 5.4 Consideration of test cord and connector grade [Go to Page]
- 5.4.1 General
- 5.4.2 Mode field diameter variation
- 5.5 Reflections from other interfaces
- Table 3 – Test limit adjustment and uncertainty related to test cord connector grade
- 5.6 Optical source
- 5.7 Output power reference
- 5.8 Bi-directional measurements
- 5.9 Typical uncertainties for attenuation methods A, B, C, and D
- Table 4 – Uncertainty for given fibre length and attenuation at 1 310 nm, 1 550 nm and 1 625 nm
- 5.10 Typical uncertainty values for single-mode attenuation testing for method E
- 6 Apparatus [Go to Page]
- 6.1 General
- 6.2 Light source [Go to Page]
- 6.2.1 Stability
- Table 5 – Uncertainty for a given fibre length at 1 310 nm and 1 550 nm using an OTDR [Go to Page]
- 6.2.2 Spectral characteristics
- Table 6 – Spectral requirements
- 6.3 Launch cord
- 6.4 Receive or tail cords
- 6.5 Substitution cord
- 6.6 Power meter – LSPM methods only
- 6.7 OTDR apparatus
- 6.8 Return loss test set
- Figure 7 – Typical OTDR schematic diagram
- 6.9 Connector end-face cleaning and inspection equipment
- 6.10 Adapters
- Figure 8 – Illustration of return loss test set
- 7 Procedures [Go to Page]
- 7.1 General
- 7.2 Common procedures [Go to Page]
- 7.2.1 Care of the test cords
- 7.2.2 Make reference measurements (LSPM and OCWR methods only)
- 7.2.3 Inspect and clean the ends of the fibres in the cabling
- 7.2.4 Make the measurements
- 7.2.5 Make the calculations
- 7.3 Calibration
- 7.4 Safety
- 8 Calculations
- 9 Documentation [Go to Page]
- 9.1 Information for each test
- 9.2 Information to be made available
- Annexes [Go to Page]
- Annex A (normative) One-cord reference method [Go to Page]
- A.1 Applicability of test method
- A.2 Apparatus
- A.3 Procedure
- A.4 Calculation
- Figure A.1 – One-cord reference measurement
- Figure A.2 – One-cord test measurement [Go to Page]
- A.5 Components of reported attenuation
- Annex B (normative) Three-cord reference method [Go to Page]
- B.1 Applicability of test method
- B.2 Apparatus
- B.3 Procedure
- Figure B.1 – Three-cord reference measurement [Go to Page]
- B.4 Calculations
- B.5 Components of reported attenuation
- Figure B.2 – Three-cord test measurement
- Annex C (normative) Two-cord reference method [Go to Page]
- C.1 Applicability of test method
- C.2 Apparatus
- C.3 Procedure
- Figure C.1 – Two-cord reference measurement
- Figure C.2 – Two-cord test measurement
- Figure C.3 – Two-cord test measurement for plug-to-socket style connectors [Go to Page]
- C.4 Calculations
- C.5 Components of reported attenuation
- Annex D (normative) Equipment cord method [Go to Page]
- D.1 Applicability of the test method
- D.2 Apparatus
- D.3 Procedure
- D.4 Calculation
- Figure D.1 – Reference measurement
- Figure D.2 – Test measurement [Go to Page]
- D.5 Components of reported attenuation
- Annex E (normative) Optical time domain reflectometer [Go to Page]
- E.1 Applicability of test method
- E.2 Apparatus [Go to Page]
- E.2.1 General
- E.2.2 OTDR
- E.2.3 Test cords
- E.3 Procedure (test method)
- Table E.1 – Typical launch and tail cord lengths [Go to Page]
- E.4 Calculation of attenuation [Go to Page]
- E.4.1 General
- E.4.2 Connection location
- Figure E.1 – Test measurement for OTDR method [Go to Page]
- [Go to Page]
- E.4.3 Definition of the power levels F1 and F2
- Figure E.2 – Location of the cabling under test ports [Go to Page]
- [Go to Page]
- E.4.4 Alternative calculation
- Figure E.3 – Graphic construction of F1 and F2 [Go to Page]
- E.5 Calculation of optical return loss
- Figure E.4 – Graphic construction of F1, F11, F21 and F2 [Go to Page]
- E.6 Calculation of reflectance for discrete components
- Figure E.5 – Graphic representation of OTDR ORL measurement
- Figure E.6 – Graphic representation of reflectance measurement [Go to Page]
- E.7 OTDR uncertainties
- Annex F (normative) Continuous wave optical return loss measurement – Method A [Go to Page]
- F.1 Applicability of test method
- F.2 Apparatus [Go to Page]
- F.2.1 General
- F.2.2 Light source
- F.2.3 Branching device or coupler
- Figure F.1 – Return loss test set illustration [Go to Page]
- [Go to Page]
- F.2.4 Power meters
- F.2.5 Connector interface
- F.2.6 Low reflection termination
- F.3 Procedure [Go to Page]
- F.3.1 Test set characterization
- Figure F.2 – Measurement of the system internal attenuation Pref2
- Figure F.3 – Measurement of the system internal attenuation Pref1
- Figure F.4 – Measurement of the system reflected power Prs [Go to Page]
- [Go to Page]
- F.3.2 Measurement procedure
- F.3.3 Calculations
- Figure F.5 – Measurement of the input power Pin
- Figure F.6 – Measurement of the reflected power Pr
- Annex G (normative) Continuous wave optical return loss measurement – Method B [Go to Page]
- G.1 Applicability of test method
- G.2 Apparatus [Go to Page]
- G.2.1 General requirements
- G.2.2 Known reflectance termination
- Figure G.1 – Return loss test set illustration [Go to Page]
- G.3 Procedure [Go to Page]
- G.3.1 Set-up characterization
- G.3.2 Measurement procedure
- Figure G.2 – Measurement of Prs with reflections suppressed
- Figure G.3 – Measurement of Pref with reference reflector [Go to Page]
- [Go to Page]
- G.3.3 Calculation
- Figure G.4 – Measurement of the system reflected power Prs
- Figure G.5 – Measurement of the reflected power Pr
- Annex H (normative) On the use of reference-grade test cords [Go to Page]
- H.1 General
- H.2 Practical configurations and assumptions [Go to Page]
- H.2.1 Component specifications
- H.2.2 Conventions
- H.2.3 Reference planes
- Table H.1 – Expected attenuation for examples [Go to Page]
- H.3 Impact of using reference-grade test cords for recommended LSPM methods
- H.4 Examples for LSPM measurements [Go to Page]
- H.4.1 Example 1 (configuration A, one-cord method, Annex A)
- Table H.2 – Test limit adjustment when using reference-grade test cords [Go to Page]
- [Go to Page]
- H.4.2 Example 2 (configuration B, three-cord method, Annex B)
- H.4.3 Example 3 (configuration C, two-cord method, Annex C)
- H.4.4 Example 4 – Long haul system (one-cord reference method)
- H.5 Impact of using reference-grade test cords for different configurations using the OTDR test method [Go to Page]
- H.5.1 Cabling configurations A, B and C
- Figure H.1 – Cabling configurations A, B and C tested with the OTDR method [Go to Page]
- [Go to Page]
- H.5.2 Cabling configuration D
- Table H.3 – Test limit adjustment when using reference-grade test cords –OTDR test method
- Figure H.2 – Cabling configuration D tested with the OTDR method
- Annex I (informative) OTDR configuration information [Go to Page]
- I.1 Introductory remarks
- I.2 Fundamental parameters that define the operational capability of an OTDR [Go to Page]
- I.2.1 Dynamic range
- I.2.2 Dynamic margin
- I.2.3 Pulse width
- I.2.4 Averaging time
- I.2.5 Dead zone
- I.3 Other parameters [Go to Page]
- I.3.1 Index of refraction
- I.3.2 Measurement range
- I.3.3 Distance sampling
- I.4 Other measurement configurations [Go to Page]
- I.4.1 General
- I.4.2 Macrobend attenuation measurement
- Table I.1 – Example of effective group index of refraction values [Go to Page]
- [Go to Page]
- I.4.3 Splice attenuation measurement
- I.4.4 Measurement with high reflection connectors or short length cabling
- Figure I.1 – Splice and macrobend attenuation measurement
- Figure I.2 – Attenuation measurement with high reflection connectors [Go to Page]
- [Go to Page]
- I.4.5 Ghost
- Figure I.3 – Attenuation measurement of a short length cabling [Go to Page]
- I.5 More on the measurement method
- Figure I.4 – OTDR trace with ghost [Go to Page]
- I.6 Bi-directional measurement
- Figure I.5 – Cursor positioning [Go to Page]
- I.7 OTDR bi-directional trace analysis
- Figure I.6 – Bi-directional OTDR trace display [Go to Page]
- I.8 Non-recommended practices [Go to Page]
- I.8.1 Measurement without tail cord
- I.8.2 Two cursors measurement
- Figure I.7 – Bi-directional OTDR trace attenuation analysis
- Annex J (informative) Test cord attenuation verification [Go to Page]
- J.1 Introductory remarks
- J.2 Apparatus
- J.3 Procedure [Go to Page]
- J.3.1 General
- J.3.2 Test cord verification for the one-cord and two-cord reference test methods when using non-pinned or unpinned and non-plug or socket style connectors
- J.3.3 Test cord verification for the one-cord and two-cord reference test methods using pinned-to-unpinned or plug-to-socket style connectors
- Figure J.1 – Obtaining reference power level P0
- Figure J.2 – Obtaining power level P1
- Figure J.3 – Obtaining reference power level P0
- Figure J.4 – Obtaining power level P1 [Go to Page]
- [Go to Page]
- J.3.4 Test cord verification for the three-cord reference test method using non-pinned or unpinned and non-plug or socket style connectors
- Figure J.5 – Obtaining reference power level P0
- Figure J.6 – Obtaining power level P1
- Figure J.7 – Obtaining reference power level P0 [Go to Page]
- [Go to Page]
- J.3.5 Test cord verification for the three-cord reference test method using pinned-to-unpinned or plug-to-socket style connectors
- Figure J.8 – Obtaining power level P1
- Figure J.9 – Obtaining power level P6
- Figure J.10 – Obtaining reference power level P0
- Figure J.11 – Obtaining power level P1
- Annex K (informative) Spectral attenuation measurement [Go to Page]
- K.1 Applicability of test method
- K.2 Apparatus [Go to Page]
- K.2.1 Broadband light source
- K.2.2 Optical spectrum analyser
- K.3 Procedure [Go to Page]
- K.3.1 Reference scan
- K.3.2 Measurement scan
- K.4 Calculations
- Figure K.1 – Result of spectral attenuation measurement
- Bibliography [Go to Page]