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eLibrary > BS IEC 61000-4-23:2016 Electromagnetic Compatibility (EMC) - Testing and measurement techniques. Test methods for protective devices for HEMP and other radiated disturbances >

BS IEC 61000-4-23:2016 Electromagnetic Compatibility (EMC) - Testing and measurement techniques. Test methods for protective devices for HEMP and other radiated disturbances, 2021

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BS IEC 61000-4-23:2016 Electromagnetic Compatibility (EMC) - Testing and measurement techniques. Test methods for protective devices for HEMP and other radiated disturbances, 2021

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CONTENTS
FOREWORD
INTRODUCTION
1 Scope
2 Normative references
3 Terms and definitions
4 HEMP test concepts [Go to Page]
4.1 General
4.2 Testing of shielding enclosures [Go to Page]
4.2.1 General
Figures [Go to Page]
Figure 1 – Example of measured magnitude and phase of the transfer function T(ω) = Hin/Hout for a shielded enclosure
Figure 2 – Electric field and magnetic field shielding effectiveness of a 0,5 mm thick aluminum enclosure [29] [Go to Page]
4.2.2 Buildings
Figure 3 – Measured magnetic field shielding effectiveness SEH for a building
Figure 4 – Conceptual illustration of the HEMP test of a building [Go to Page]
4.2.3 Shelters and shielded rooms
4.2.4 Cabinets, racks and boxes
Figure 5 – Illustration of a shielded room or enclosure excited by HEMP fields
Figure 6 – Illustration of equipment racks, cabinets and box excited by internal HEMP disturbance
Figure 7 – A general shield excited by current injection
4.3 Testing of shielded cables and connectors [Go to Page]
4.3.1 General
4.3.2 Testing of cable shields
Figure 8 – Basic configuration for transfer impedance measurement
Figure 9 – Measured transfer impedance magnitude and phase of transfer impedance per unit length for four braided shield cables with good shielding properties [Go to Page]
4.3.3 Testing of cable connectors
Figure 10 – Basic configuration for transfer admittance measurement
Figure 11 – Test configuration for transfer impedance measurement of a cable connector
4.4 Testing of shielding materials [Go to Page]
4.4.1 General
4.4.2 Conducting gaskets
Figure 12 – Examples of conducting gaskets used as HEMP protection devices
Figure 13 – Circuit model representing the behaviour of a conducting gasket for HEMP protection [Go to Page]
4.4.3 Conducting sheets and screens
Figure 14 – Measurement configuration for the resistivity of a sample
Figure 15 – Test concept for measuring the resistivity with surface probes [Go to Page]
4.4.4 Cut-off waveguides and honeycombs
Figure 16 – Concepts for shielding effectiveness measurement of conducting sheets and screens
Figure 17 – Example of the calculated plane-wave shielding effectivenes sof a 0,01 mm thick plate of different material as a function of frequency
4.5 Summary of test concepts
Figure 18 – Cut-off waveguides and honeycomb used as protective elements
5 Test methods for measuring the shielding effectiveness of HEMP protection facilities [Go to Page]
5.1 General
5.2 Electromagnetic field testing [Go to Page]
5.2.1 General
5.2.2 Pulse field testing
Tables [Go to Page]
Table 1 – Recommended test procedure for different test objects
Figure 19 – Examples of full-scale, pulse-radiating HEMP simulators
Figure 20 – Test procedure for the pulse test [Go to Page]
5.2.3 CW field testing
Figure 21 – Typical configuration of a CW test facility
Figure 22 – Example CW measurement set-up
Figure 23 – Test and analysis procedures for conducting a CW test
Figure 24 – Analysis flow diagram for extrapolatinga measured CW spectrum to the HEMP response
Figure 25 – Example scan from 9 kHz to 3 GHz for the ambient electromagnetic field from communication signals
Figure 26 – Test procedure for the ambient EM excitation test
Figure 27 – Double-ended TEM cell for field illumination testing of small enclosures
Figure 28 – Example test set-up for field illumination in the TEM cell
Figure 29 – Illustration of the single-ended TEM cell and associated equipment
Figure 30 – Test set-up for the plane-wave shielding effectiveness measurements
Table 2 – Dimensions and composition of distances d1 to d3, with reference to Figure 30
Figure 31 – Test set-up for the H-field shielding effectiveness measurements
Table 3 – Dimensions and composition of distances d1 to d3, with reference to Figure 31
Figure 32 – Example of antenna locations for the localized antenna tests for a hypothetical shielded enclosure or facility
Table 4 – Measurement frequencies and antennas in plane-wave
Table 5 – Measurement frequencies and antennas in magnetic field
5.3 Current injection test procedures [Go to Page]
5.3.1 General
5.3.2 Injection testing of enclosures
Figure 33 – Test concept and equipment configuration for current injection testing of a shielded enclosure or box [Go to Page]
5.3.3 Transfer impedance and admittance of cable shields and connectors
5.3.4 Testing of gasket material
Figure 34 – Surface probe for volume resistivity measurement
Annexes [Go to Page]
Annex A (informative) HEMP test concepts for electrical systems [Go to Page]
A.1 Overview
A.2 Types of HEMP tests [Go to Page]
A.2.1 General
A.2.2 System-level transient tests
A.2.3 CW field illumination tests
A.2.4 Current injection testing
A.2.5 Partial illumination testing
A.2.6 Subsystem and component testing
A.3 Definition of the testing interface
Figure A.1 – Sample HEMP interaction diagram illustrating penetration mechanisms, system responses and generic test interface locations [Go to Page]
A.4 Use of test data [Go to Page]
A.4.1 General
A.4.2 Acceptance of new systems
A.4.3 System assessments
A.4.4 Hardness surveillance monitoring
A.4.5 System design
A.5 Testing uncertainties
Annex B (informative) Characterization of shielded cables [Go to Page]
B.1 Fundamentals of cable shielding
Figure B.1 – Geometry of a shielded coaxial line with an internal circuit [Go to Page]
B.2 Definitions of transfer impedance and transfer admittance
Figure B.2 – Coaxial cable located over a conducting ground plane
Figure B.3 – Two per-unit-length circuits formed by the sheath and its ground return, and the sheath and the internal conductor [Go to Page]
B.3 Relative significance of Z′t and Y′t
Annex C (informative) Equipment for HEMP pulse measurements [Go to Page]
C.1 General
C.2 Sensors for HEMP measurements [Go to Page]
C.2.1 B- and H-field sensors
Figure C.1 – Magnetic field sensors [23]
Figure C.2 – Single-slot, cylindrical coil sensor [23] [Go to Page]
[Go to Page]
C.2.2 D- and E-field sensors
Figure C.3 – Two- and four-slot cylindrical coil sensors [23]
Figure C.4 – Electrical configuration of an E-field sensor [23]
Figure C.5 – Biconical E-field sensor
Figure C.6 – E-field sensor mounted on a conducting ground plane [23]
Figure C.7 – Equipotential shapes for an optimally designed E-field sensor [23] [Go to Page]
[Go to Page]
C.2.3 Current sensors
Figure C.8 – Rogowski coil used for current measurements [23]
Figure C.9 – Toroidal current sensor made of magnetic material [23]
Figure C.10 – Voltage pick-up points on the edges of the toroidal sensor [23] [Go to Page]
C.3 Signal transmission [Go to Page]
C.3.1 General
C.3.2 Fibre optic links
Figure C.11 – Example of a single-channel fibre optic transmission system [23] [Go to Page]
[Go to Page]
C.3.3 Fibre optic transducers
C.4 Signal detection and processing
Figure C.12 – Attenuation of coaxial linesand fibre optic cables as a function of frequency
Annex D (informative) Equipment for CW testing [Go to Page]
D.1 General
D.2 Antenna system
Figure D.1 – Various antennas for CW testing [Go to Page]
D.3 Power amplifier
Figure D.2 – Relationship between the CW antenna and the incident HEMP field [Go to Page]
D.4 Receiver (network analyser)
D.5 Reference and response sensors
Figure D.3 – Incident and ground-reflected field contributions to the reference sensor excitations [Go to Page]
D.6 Fibre optic system
Figure D.4 – Measured reference H-field spectrum and its inverse Fourier transform
Figure D.5 – Measured sensor responses and calibration function
Figure D.6 – Measured transfer function, corrected by calibration file [Go to Page]
D.7 Limitations of measurements
Annex E (informative) Characterization of a planar shield for HEMP protection [Go to Page]
E.1 General
Figure E.1 – Example of a general shielding problem [Go to Page]
E.2 Problem geometry
Figure E.2 – Behaviour of the impedance ratio |E|/|H | as a function of distance from a source [29] [Go to Page]
E.3 Equivalent circuit representation [Go to Page]
E.3.1 General
Figure E.3 – Conducting slab of thickness, d, and infinite extent serving as an electromagnetic barrier [Go to Page]
[Go to Page]
E.3.2 Chain parameter representation of the shield
Figure E.4 – Equivalent circuit representation of the shielding problem [Go to Page]
[Go to Page]
E.3.3 Circuit responses
Figure E.5 – Two-port representation of a circuit
Table E.1 – Surface resistance and electrical parameters for selected materials
Annex F (informative) Inside-to-out measurement method [Go to Page]
F.1 Purpose
F.2 Comparison of existing SE test methods
F.3 Inside-to-out SE test of shielded rooms [Go to Page]
F.3.1 Measurements of the inside-to-out SE
Table F.1 – Comparison with other standards
Table F.2 – Test shielded rooms
Figure F.1 – Test set-up for the outside-to-in and inside-to-out SE measurement [Go to Page]
[Go to Page]
F.3.2 Summary
Table F.3 – Comparison of the SE measurement results
Bibliography [Go to Page]

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BS IEC 61000-4-23:2016 Electromagnetic Compatibility (EMC) - Testing and measurement techniques. Test methods for protective devices for HEMP and other radiated disturbances, 2021

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