MADCAD.com - The Cloud-Based Reference Library

- Free Trial - Webinar - Feedback

Cart (0)

No items in cart.

Total

There is a technical issue about last added item. You can click "Report to us" button to let us know and we resolve the issue and return back to you or you can continue without last item via click to continue button.

Home

Content

Tour

eLibrary

Store

Not a subscriber? Register for a trial account.

Username:
Password:

Incorrect username/password.

Already a subscriber?

MADCAD.com Free Trial

Sign up for a 3 day free trial to explore the MADCAD.com interface, PLUS access the
2009 International Building Code to see how it all works.

If you like to setup a quick demo, let us know at support@madcad.com
or +1 800.798.9296 and we will be happy to schedule a webinar for you.

Email *
Password *
Confirm *
First Name *
Last Name *
Title
Company Name *
Company Size *
Industry *
Address *
Address 2
City *
State *	Zip *
Country *
Phone *
How did you hear about MADCAD.com? *

Print page(s), starting from page (current page)

Continue to Print

Reset password

Enter your personal account email address to request
a password reset:

Reset password

Enter your account email address to request
a password reset:

Save As:

Are you sure you want to delete this group?

Security check

Please check the following box:

Please login to your personal account to use this feature.

Email:

Password:

Forgot your password?

Remember me for one month

Need a login? Register now.

Please login to your authorized staff account to use this feature.

Username:

Password:

Are you sure you want to empty the cart?

There were no books found for the applied search filters.

CLICK TO START OVER

Report To Us

Please fill the form below so that we can contact you.

Full name*
Email*
Phone

Contact us for a custom quote

Please fill the form below and a member of our staff will contact you shortly. The contents of your cart will automatically be sent to us so we can provide an accurate custom quote.

Company*
Full name*
Email*
Phone

⨯To continue with accurate pricing,
please select your company type below:

Large goverment organizations

Large multi-national corporation (more than $5B annual revenue)

None of the above

Your company has a special pricing case for IEEE.
For pricing, please contact us by filling out the form.

Full name*
Email*
Phone
Your selection

⨯We need your input!

Are you a code official in a jurisdiction with less than 300,000 population?

Yes No

This item is only available for the code officials of jurisdictions less then 300K population.

If you do not meet the criteria item will be removed and you will be able to continue shopping other items.

⨯ We need your input!

Your company has a special pricing case for ASME.
Please make sure the information you provide below is accurate.

Company Industry
Number Of Employees
Revenue

Pricing for the ASME publications in the store is for a 1-4 employee company in Construction Industry with revenue under $500,000.
If correct company info does not match what is publicly available info we will suspend the access and contact you for correction.
Please call 1-800-798-9296 if you have any questions.
If your company has more than 5,000 employee or more than 500 mil revenue please email us at info@madcad.com to receive a special quote, use "ASME Quote" on the subject line.

Cart Warning

Search book title

Search book content

Clear all filters Advanced Search Basic Search

Download File

eLibrary > BS IEC/IEEE 63195-1:2022 Assessment of power density of human exposure to radio frequency fields from wireless devices in close proximity to the head and body (frequency range of 6 GHz to 300 GHz) - Measurement procedure >

BS IEC/IEEE 63195-1:2022 Assessment of power density of human exposure to radio frequency fields from wireless devices in close proximity to the head and body (frequency range of 6 GHz to 300 GHz) - Measurement procedure, 2022

Expand All

TOC Search:

BS IEC/IEEE 63195-1:2022 Assessment of power density of human exposure to radio frequency fields from wireless devices in close proximity to the head and body (frequency range of 6 GHz to 300 GHz) - Measurement procedure, 2022

undefined
English [Go to Page]
CONTENTS
FOREWORD
INTRODUCTION
1 Scope
2 Normative references
3 Terms and definitions [Go to Page]
3.1 Exposure metrics and parameters
3.2 Spatial, physical, and geometrical parameters associated with exposure metrics
3.3 Measurement instrumentation, field probe, and data-processing parameters
3.4 RF power parameters
3.5 Test device technical operating and antenna parameters
3.6 Test device physical configurations
3.7 Uncertainty parameters
4 Symbols and abbreviated terms [Go to Page]
4.1 Symbols [Go to Page]
4.1.1 Physical quantities
4.1.2 Constants
4.2 Abbreviated terms
5 Quick start guide and application of this document [Go to Page]
5.1 Quick start guide
Tables [Go to Page]
Table 1 – Evaluation plan check-list
Figures [Go to Page]
Figure 1 – Quick Start Guide
5.2 Application of this document
5.3 Stipulations
6 Measurement system and laboratory requirements [Go to Page]
6.1 General requirements
6.2 Laboratory requirements
6.3 Field probe requirements
6.4 Measurement instrumentation requirements
6.5 Scanning system requirements [Go to Page]
6.5.1 Single-probe systems
6.5.2 Multiple field-probe systems
6.6 Device holder requirements
6.7 Post-processing quantities, procedures, and requirements [Go to Page]
6.7.1 Formulas for calculation of sPD
6.7.2 Post-processing procedure
6.7.3 Requirements
Figure 2 – Simplified view of a generic measurement setupinvolving the use of reconstruction algorithms
7 Protocol for PD assessment [Go to Page]
7.1 General
7.2 Measurement preparation [Go to Page]
7.2.1 Relative system check
7.2.2 DUT requirements
7.2.3 DUT preparation
7.2.4 Selecting evaluation surfaces
Figure 3 – Cross-sectional view of SAM phantom for SAR evaluationsat the reference plane, as described in IEC/IEEE 62209-1528:2020
Figure 4 – Cross-sectional view of SAM virtual phantom for PD evaluations at the reference plane (shell thickness is 2 mm everywhere, including at the pinna)
7.3 Tests to be performed [Go to Page]
7.3.1 General
Figure 5 – Example reference coordinate system forthe left-ear ERP of the SAM phantom
Figure 6 – Example reference points and vertical and horizontal lines on a DUT [Go to Page]
7.3.2 Tests to be performed when supported by simulations of the antenna array
Figure 7 – Flow chart for test procedure in 7.3 [Go to Page]
7.3.3 Tests to be performed by measurements of the antenna array
7.4 Measurement procedure [Go to Page]
7.4.1 General measurement procedure
7.4.2 Power density assessment methods
Figure 8 – Flow chart for general measurement procedure in 7.4.1
Figure 9 – Flow chart for power density assessment methods in 7.4.2
Table 2 – Minimum evaluation distance between the DUT antenna andthe evaluation surface for which the plane wave equivalent approximation applies [Go to Page]
7.4.3 Power scaling for operating mode and channel
7.4.4 Correction for DUT drift
7.5 Exposure combining [Go to Page]
7.5.1 General
7.5.2 Combining power density and SAR results
Figure 10 – SAR and power density evaluation at a point r
Figure 11 – Combining SAR (top) and power density (bottom) for the SAM phantom
8 Uncertainty estimation [Go to Page]
8.1 General
8.2 Requirements for uncertainty evaluations
8.3 Description of uncertainty models
8.4 Uncertainty terms dependent on the measurement system [Go to Page]
8.4.1 CAL – Calibration of the measurement equipment
8.4.2 COR – Probe correction
8.4.3 FRS – Frequency response
8.4.4 SCC – Sensor cross coupling
8.4.5 ISO – Isotropy
8.4.6 LIN – System linearity error
8.4.7 PSC – Probe scattering
8.4.8 PPO – Probe positioning offset
8.4.9 PPR – Probe positioning repeatability
8.4.10 SMO – Sensor mechanical offset
8.4.11 PSR – Probe spatial resolution
8.4.12 FLD – Field impedance dependence (ratio |E|/|H|)
8.4.13 MED – Measurement drift
8.4.14 APN – Amplitude and phase noise
8.4.15 TR – Measurement area truncation
8.4.16 DAQ – Data acquisition
8.4.17 SMP – Sampling
8.4.18 REC – Field reconstruction
8.4.19 SNR – Signal-to-noise ratio
8.4.20 TRA – Forward transformation and backward transformation
8.4.21 SCA – Power density scaling
8.4.22 SAV – Spatial averaging
8.4.23 COM – Exposure combining
8.5 Uncertainty terms dependent on the DUT and environmental factors [Go to Page]
8.5.1 PC – Probe coupling with DUT
8.5.2 MOD – Modulation response
8.5.3 IT – Integration time
8.5.4 RT – Response time
8.5.5 DH – Device holder influence
8.5.6 DA – DUT alignment
8.5.7 AC – RF ambient conditions
8.5.8 TEM – Laboratory temperature
8.5.9 REF – Reflections in laboratory
8.5.10 MSI – Measurement system immunity/secondary reception
8.5.11 DRI – DUT drift
8.6 Combined and expanded uncertainty
Table 3 – Template of measurement uncertainty for power density measurements
Table 4 – Example measurement uncertainty budget forpower density measurement results
9 Measurement report [Go to Page]
9.1 General
9.2 Items to be recorded in measurement reports
Annex A (normative)Measurement system check and system validation tests [Go to Page]
A.1 Overview
A.2 Normalization to total radiated power [Go to Page]
A.2.1 General
A.2.2 Option 1: Accepted power measurement
Figure A.1 – Recommended accepted power measurement setupfor relative system check, absolute system check and system validation
Figure A.2 – Equipment setup for measurement offorward power Pf and forward coupled power Pfc
Figure A.3 – Equipment setup for measuringthe shorted reverse coupled power Prcs
Figure A.4 – Equipment setup for measuring thepower with the reference antenna
Figure A.5 – Port numbering for the S-parametermeasurements of the directional coupler [Go to Page]
A.2.3 Option 2: Total radiated power measurement
Table A.1 – Example of power measurement uncertainty
A.3 Relative system check [Go to Page]
A.3.1 Purpose
A.3.2 Antenna and test conditions
A.3.3 Procedure
A.3.4 Acceptance criteria
A.4 Absolute system check [Go to Page]
A.4.1 Purpose
A.4.2 Antenna and test conditions
A.4.3 Procedure
A.4.4 Acceptance criteria
A.5 System validation [Go to Page]
A.5.1 Purpose
A.5.2 Procedure
A.5.3 Validation of modulation response
A.5.4 Acceptance criteria
Table A.2 – Communication signals for modulation response test
Annex B (normative)Antennas for system check and system validation tests [Go to Page]
B.1 General
B.2 Pyramidal horn antennas for system checks
Table B.1 – Target values for pyramidal horn antennas at different frequencies
B.3 Cavity-fed dipole arrays for system validation [Go to Page]
B.3.1 Description
Table B.2 – Main dimensions for the cavity-fed dipole arraysat each frequency of interest
Figure B.1 – Main dimensions for the cavity-fed dipole arrays – 30 GHz design
Table B.3 – Geometrical parameters of the cavity-fed dipole arraysat each frequency of interest
Table B.4 – Substrate and metallic block parameters for the cavity-fed dipole arrays at each frequency of interest [Go to Page]
B.3.2 Numerical target values for cavity-fed dipole arrays
B.3.3 Field and power density distribution patterns
Table B.5 – Target values for the cavity-fed dipole arrays at10 GHz, 30 GHz, 60 GHz, and 90 GHz
Figure B.2 – 10 GHz patterns of |Etotal| and Re{S}total for the cavity-fed dipole arrays at distances ofa) 2 mm, b) 5 mm, c) 10 mm, and d) 50 mm from the upper surface of the dielectric substrate
Figure B.3 – 30 GHz patterns of |Etotal| and Re{S}total for the cavity-fed dipole arrays at distances ofa) 2 mm, b) 5 mm, c) 10 mm, and d) 50 mm from the upper surface of the dielectric substrate
Figure B.4 – 60 GHz patterns of |Etotal| and Re{S}total for the cavity-fed dipole arrays at distances ofa) 2 mm, b) 5 mm, c) 10 mm, and d) 50 mm from the upper surface of the dielectric substrate
Figure B.5 – 90 GHz patterns of |Etotal| and Re{S}total for the cavity-fed dipole arrays at distances ofa) 2 mm, b) 5 mm, c) 10 mm, and d) 50 mm from the upper surface of the dielectric substrate [Go to Page]
B.3.4 Far-field radiation patterns
Figure B.6 – Far-field radiation patterns of a) 10 GHz, b) 30 GHz,c) 60 GHz, and d) 90 GHz cavity-fed dipole arrays
B.4 Pyramidal horns with slot arrays for system validation [Go to Page]
B.4.1 Description
Figure B.7 – Main dimensions for the 0,15 mm stainless steel stencil with slot array
Figure B.8 – Main dimensions for the pyramidal horn antennas
Table B.6 – Main dimensions for the stencilwith slot array for each frequency [Go to Page]
B.4.2 Numerical target values for pyramidal horns loaded with a slot array
Table B.7 – Primary dimensions for the correspondingpyramidal horns at each frequency [Go to Page]
B.4.3 Field and power density distribution patterns
Table B.8 – Target values for the pyramidal horns loaded with slot arraysat 10 GHz, 30 GHz, 60 GHz, and 90 GHz
Figure B.9 – 10 GHz patterns of |Etotal| and Re{S}total for the pyramidal horn loaded with a slot arrayat distances of a) 2 mm, b) 5 mm, c) 10 mm, and d) 50 mm from the upper surface of the slot array
Figure B.10 – 30 GHz patterns of |Etotal| and Re{S}total for the pyramidal horn loaded with a slot arrayat distances of a) 2 mm, b) 5 mm, c) 10 mm, and d) 50 mm from the upper surface of the slot array
Figure B.11 – 60 GHz patterns of |Etotal| and Re{S}total for the pyramidal horn loaded with a slot arrayat distances of a) 2 mm, b) 5 mm, c) 10 mm, and d) 50 mm from the upper surface of the slot array
Figure B.12 – 90 GHz patterns of |Etotal| and Re{S}total for the pyramidal horn loaded with a slot arrayat distances of a) 2 mm, b) 5 mm, c) 10 mm, and d) 50 mm from the upper surface of the slot array [Go to Page]
B.4.4 Far-field radiation patterns
B.5 Antenna validation procedure [Go to Page]
B.5.1 General
Figure B.13 – Far-field radiation patterns of a) 10 GHz, b) 30 GHz,c) 60 GHz, and d) 90 GHz pyramidal horn loaded with a slot array [Go to Page]
B.5.2 Objectives, scope, and usage specifications
B.5.3 Antenna design
B.5.4 Numerical targets
B.5.5 Reference antennas calibration
B.5.6 Antenna verification and life expectation
B.5.7 Uncertainty budget considerations
B.6 Validation procedure for wideband signals [Go to Page]
B.6.1 General
B.6.2 Validation signals
B.6.3 Validation antennas and setup
B.6.4 Target values for validation antennas transmitting wideband signals
B.6.5 Wideband signal uncertainty
B.6.6 Validation procedure
Annex C (normative)Calibration and characterization of measurement probes [Go to Page]
C.1 General
C.2 Calibration of waveguide probes [Go to Page]
C.2.1 General
C.2.2 Sensitivity
C.2.3 Linearity
C.2.4 Lower detection limit
C.2.5 Isotropy
C.2.6 Response time
C.3 Calibration for isotropic scalar E-field or H-field probes [Go to Page]
C.3.1 General
C.3.2 Sensitivity
C.3.3 Isotropy
C.3.4 Linearity
C.3.5 Lower detection limit
C.3.6 Response time
C.4 Calibration of phasor E-field or H-field probes [Go to Page]
C.4.1 General
C.4.2 Sensitivity
C.4.3 Isotropy
C.4.4 Linearity
C.4.5 Lower detection limit
C.5 Calibration uncertainty parameters [Go to Page]
C.5.1 General
C.5.2 Input power to the antenna
C.5.3 Mismatch effect (input power measurement)
C.5.4 Gain and offset distance
C.5.5 Signal spectrum
C.5.6 Setup stability
C.5.7 Uncertainty for field impedance variations
C.6 Uncertainty budget template
Table C.1 – Uncertainty analysis of the probe calibration
Annex D (informative)Information on use of square or circular shapes for power density averaging area in conformity evaluations [Go to Page]
D.1 General
D.2 Method using computational analysis
D.3 Areas averaged with square and circular shapes on planar evaluation surface
Figure D.1 – Schematic view of the assessment of the variationof sPD using square shape by rotating AUT (antenna under test)
Figure D.2 – Comparison of psPD averaged using square versus circular shaped areas on planar evaluation surfaces
D.4 Areas averaged with square and circular shapes on nonplanar evaluation surface
Figure D.3 – Example PD distributions withdevice next to ear evaluation surface
Table D.1 – Phase shift values for the array antenna
Figure D.4 – Comparison of psPD averaged using cube cross-section (square-like) versus sphere cross-section (circular-like) shaped areas fordevice next to ear evaluation surface
Annex E (informative)Reconstruction algorithms [Go to Page]
E.1 General
E.2 Methodologies to extract local field components and power densities [Go to Page]
E.2.1 General
E.2.2 Phase-less approaches
E.2.3 Approaches using E-field polarization ellipse measurements
E.2.4 Direct near-field measurements
E.3 Forward transformation (propagation) of the fields [Go to Page]
E.3.1 General
Figure E.1 – Simulation (left) and forward transformation from measurements applying methods described in [29] (right) of power density in the xz-plane (above) and yz-plane (below) at a distance of 2 mm for a cavity-fed dipole array at 30 GHz (see Annex B) [Go to Page]
E.3.2 Field expansion methods
E.3.3 Field integral equation methods
E.4 Backward transformation (propagation) of the fields [Go to Page]
E.4.1 General
E.4.2 Field expansion methods – the plane wave expansion
E.4.3 Inverse source methods
E.5 Analytical reference functions
Table E.1 – List of analytical reference functionsand associated psPDn+ target values
Table E.2 – List of analytical reference functionsand associated psPDtot+ target values
Table E.3 – List of analytical reference functionsand associated psPDmod+ target values
Annex F (normative)Interlaboratory comparisons [Go to Page]
F.1 Purpose
F.2 Reference devices
F.3 Power setup
F.4 Interlaboratory comparison – procedure
Annex G (informative)PD test and verification example [Go to Page]
G.1 Purpose
G.2 DUT overview
G.3 Test system verification
G.4 Test setup
G.5 Power density results
G.6 Combined exposure (Total Exposure Ratio)
Annex H (informative)Applicability of plane-wave equivalent approximations [Go to Page]
H.1 Objective
H.2 Method
H.3 Results
H.4 Discussion
Figure H.1 – psPDpwe / psPDtot as function of distance (in units of λ) from cavity-fed dipole array (CDA##G, left-side) and pyramidal horn with slot arrays (SH##G,right-side) operating at 10 GHz, 30 GHz, 60 GHz, and 90 GHz
Annex I (informative)Rationales for concepts and methods applied inthis document and IEC/IEEE 63195-2 [Go to Page]
I.1 Frequency range
I.2 Calculation of sPD [Go to Page]
I.2.1 Application of the Poynting vector for calculation of incident power density
I.2.2 Averaging area
Bibliography [Go to Page]

About Us / Careers / support@madcad.com / 1.800.798.9296

MADCAD.com Free Trial

Report To Us

Contact us for a custom quote

⨯To continue with accurate pricing, please select your company type below:

⨯We need your input!

⨯ We need your input!

Cart Warning

BS IEC/IEEE 63195-1:2022 Assessment of power density of human exposure to radio frequency fields from wireless devices in close proximity to the head and body (frequency range of 6 GHz to 300 GHz) - Measurement procedure, 2022

⨯To continue with accurate pricing,
please select your company type below: