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BS IEC/IEEE 63195-1:2022 Assessment of power density of human exposure to radio frequency fields from wireless devices in close proximity to the head and body (frequency range of 6 GHz to 300 GHz) - Measurement procedure, 2022
- undefined
- English [Go to Page]
- CONTENTS
- FOREWORD
- INTRODUCTION
- 1 Scope
- 2 Normative references
- 3 Terms and definitions [Go to Page]
- 3.1 Exposure metrics and parameters
- 3.2 Spatial, physical, and geometrical parameters associated with exposure metrics
- 3.3 Measurement instrumentation, field probe, and data-processing parameters
- 3.4 RF power parameters
- 3.5 Test device technical operating and antenna parameters
- 3.6 Test device physical configurations
- 3.7 Uncertainty parameters
- 4 Symbols and abbreviated terms [Go to Page]
- 4.1 Symbols [Go to Page]
- 4.1.1 Physical quantities
- 4.1.2 Constants
- 4.2 Abbreviated terms
- 5 Quick start guide and application of this document [Go to Page]
- 5.1 Quick start guide
- Tables [Go to Page]
- Table 1 – Evaluation plan check-list
- Figures [Go to Page]
- Figure 1 – Quick Start Guide
- 5.2 Application of this document
- 5.3 Stipulations
- 6 Measurement system and laboratory requirements [Go to Page]
- 6.1 General requirements
- 6.2 Laboratory requirements
- 6.3 Field probe requirements
- 6.4 Measurement instrumentation requirements
- 6.5 Scanning system requirements [Go to Page]
- 6.5.1 Single-probe systems
- 6.5.2 Multiple field-probe systems
- 6.6 Device holder requirements
- 6.7 Post-processing quantities, procedures, and requirements [Go to Page]
- 6.7.1 Formulas for calculation of sPD
- 6.7.2 Post-processing procedure
- 6.7.3 Requirements
- Figure 2 – Simplified view of a generic measurement setupinvolving the use of reconstruction algorithms
- 7 Protocol for PD assessment [Go to Page]
- 7.1 General
- 7.2 Measurement preparation [Go to Page]
- 7.2.1 Relative system check
- 7.2.2 DUT requirements
- 7.2.3 DUT preparation
- 7.2.4 Selecting evaluation surfaces
- Figure 3 – Cross-sectional view of SAM phantom for SAR evaluationsat the reference plane, as described in IEC/IEEE 62209-1528:2020
- Figure 4 – Cross-sectional view of SAM virtual phantom for PD evaluations at the reference plane (shell thickness is 2 mm everywhere, including at the pinna)
- 7.3 Tests to be performed [Go to Page]
- 7.3.1 General
- Figure 5 – Example reference coordinate system forthe left-ear ERP of the SAM phantom
- Figure 6 – Example reference points and vertical and horizontal lines on a DUT [Go to Page]
- 7.3.2 Tests to be performed when supported by simulations of the antenna array
- Figure 7 – Flow chart for test procedure in 7.3 [Go to Page]
- 7.3.3 Tests to be performed by measurements of the antenna array
- 7.4 Measurement procedure [Go to Page]
- 7.4.1 General measurement procedure
- 7.4.2 Power density assessment methods
- Figure 8 – Flow chart for general measurement procedure in 7.4.1
- Figure 9 – Flow chart for power density assessment methods in 7.4.2
- Table 2 – Minimum evaluation distance between the DUT antenna andthe evaluation surface for which the plane wave equivalent approximation applies [Go to Page]
- 7.4.3 Power scaling for operating mode and channel
- 7.4.4 Correction for DUT drift
- 7.5 Exposure combining [Go to Page]
- 7.5.1 General
- 7.5.2 Combining power density and SAR results
- Figure 10 – SAR and power density evaluation at a point r
- Figure 11 – Combining SAR (top) and power density (bottom) for the SAM phantom
- 8 Uncertainty estimation [Go to Page]
- 8.1 General
- 8.2 Requirements for uncertainty evaluations
- 8.3 Description of uncertainty models
- 8.4 Uncertainty terms dependent on the measurement system [Go to Page]
- 8.4.1 CAL – Calibration of the measurement equipment
- 8.4.2 COR – Probe correction
- 8.4.3 FRS – Frequency response
- 8.4.4 SCC – Sensor cross coupling
- 8.4.5 ISO – Isotropy
- 8.4.6 LIN – System linearity error
- 8.4.7 PSC – Probe scattering
- 8.4.8 PPO – Probe positioning offset
- 8.4.9 PPR – Probe positioning repeatability
- 8.4.10 SMO – Sensor mechanical offset
- 8.4.11 PSR – Probe spatial resolution
- 8.4.12 FLD – Field impedance dependence (ratio |E|/|H|)
- 8.4.13 MED – Measurement drift
- 8.4.14 APN – Amplitude and phase noise
- 8.4.15 TR – Measurement area truncation
- 8.4.16 DAQ – Data acquisition
- 8.4.17 SMP – Sampling
- 8.4.18 REC – Field reconstruction
- 8.4.19 SNR – Signal-to-noise ratio
- 8.4.20 TRA – Forward transformation and backward transformation
- 8.4.21 SCA – Power density scaling
- 8.4.22 SAV – Spatial averaging
- 8.4.23 COM – Exposure combining
- 8.5 Uncertainty terms dependent on the DUT and environmental factors [Go to Page]
- 8.5.1 PC – Probe coupling with DUT
- 8.5.2 MOD – Modulation response
- 8.5.3 IT – Integration time
- 8.5.4 RT – Response time
- 8.5.5 DH – Device holder influence
- 8.5.6 DA – DUT alignment
- 8.5.7 AC – RF ambient conditions
- 8.5.8 TEM – Laboratory temperature
- 8.5.9 REF – Reflections in laboratory
- 8.5.10 MSI – Measurement system immunity/secondary reception
- 8.5.11 DRI – DUT drift
- 8.6 Combined and expanded uncertainty
- Table 3 – Template of measurement uncertainty for power density measurements
- Table 4 – Example measurement uncertainty budget forpower density measurement results
- 9 Measurement report [Go to Page]
- 9.1 General
- 9.2 Items to be recorded in measurement reports
- Annex A (normative)Measurement system check and system validation tests [Go to Page]
- A.1 Overview
- A.2 Normalization to total radiated power [Go to Page]
- A.2.1 General
- A.2.2 Option 1: Accepted power measurement
- Figure A.1 – Recommended accepted power measurement setupfor relative system check, absolute system check and system validation
- Figure A.2 – Equipment setup for measurement offorward power Pf and forward coupled power Pfc
- Figure A.3 – Equipment setup for measuringthe shorted reverse coupled power Prcs
- Figure A.4 – Equipment setup for measuring thepower with the reference antenna
- Figure A.5 – Port numbering for the S-parametermeasurements of the directional coupler [Go to Page]
- A.2.3 Option 2: Total radiated power measurement
- Table A.1 – Example of power measurement uncertainty
- A.3 Relative system check [Go to Page]
- A.3.1 Purpose
- A.3.2 Antenna and test conditions
- A.3.3 Procedure
- A.3.4 Acceptance criteria
- A.4 Absolute system check [Go to Page]
- A.4.1 Purpose
- A.4.2 Antenna and test conditions
- A.4.3 Procedure
- A.4.4 Acceptance criteria
- A.5 System validation [Go to Page]
- A.5.1 Purpose
- A.5.2 Procedure
- A.5.3 Validation of modulation response
- A.5.4 Acceptance criteria
- Table A.2 – Communication signals for modulation response test
- Annex B (normative)Antennas for system check and system validation tests [Go to Page]
- B.1 General
- B.2 Pyramidal horn antennas for system checks
- Table B.1 – Target values for pyramidal horn antennas at different frequencies
- B.3 Cavity-fed dipole arrays for system validation [Go to Page]
- B.3.1 Description
- Table B.2 – Main dimensions for the cavity-fed dipole arraysat each frequency of interest
- Figure B.1 – Main dimensions for the cavity-fed dipole arrays – 30 GHz design
- Table B.3 – Geometrical parameters of the cavity-fed dipole arraysat each frequency of interest
- Table B.4 – Substrate and metallic block parameters for the cavity-fed dipole arrays at each frequency of interest [Go to Page]
- B.3.2 Numerical target values for cavity-fed dipole arrays
- B.3.3 Field and power density distribution patterns
- Table B.5 – Target values for the cavity-fed dipole arrays at10 GHz, 30 GHz, 60 GHz, and 90 GHz
- Figure B.2 – 10 GHz patterns of |Etotal| and Re{S}total for the cavity-fed dipole arrays at distances ofa) 2 mm, b) 5 mm, c) 10 mm, and d) 50 mm from the upper surface of the dielectric substrate
- Figure B.3 – 30 GHz patterns of |Etotal| and Re{S}total for the cavity-fed dipole arrays at distances ofa) 2 mm, b) 5 mm, c) 10 mm, and d) 50 mm from the upper surface of the dielectric substrate
- Figure B.4 – 60 GHz patterns of |Etotal| and Re{S}total for the cavity-fed dipole arrays at distances ofa) 2 mm, b) 5 mm, c) 10 mm, and d) 50 mm from the upper surface of the dielectric substrate
- Figure B.5 – 90 GHz patterns of |Etotal| and Re{S}total for the cavity-fed dipole arrays at distances ofa) 2 mm, b) 5 mm, c) 10 mm, and d) 50 mm from the upper surface of the dielectric substrate [Go to Page]
- B.3.4 Far-field radiation patterns
- Figure B.6 – Far-field radiation patterns of a) 10 GHz, b) 30 GHz,c) 60 GHz, and d) 90 GHz cavity-fed dipole arrays
- B.4 Pyramidal horns with slot arrays for system validation [Go to Page]
- B.4.1 Description
- Figure B.7 – Main dimensions for the 0,15 mm stainless steel stencil with slot array
- Figure B.8 – Main dimensions for the pyramidal horn antennas
- Table B.6 – Main dimensions for the stencilwith slot array for each frequency [Go to Page]
- B.4.2 Numerical target values for pyramidal horns loaded with a slot array
- Table B.7 – Primary dimensions for the correspondingpyramidal horns at each frequency [Go to Page]
- B.4.3 Field and power density distribution patterns
- Table B.8 – Target values for the pyramidal horns loaded with slot arraysat 10 GHz, 30 GHz, 60 GHz, and 90 GHz
- Figure B.9 – 10 GHz patterns of |Etotal| and Re{S}total for the pyramidal horn loaded with a slot arrayat distances of a) 2 mm, b) 5 mm, c) 10 mm, and d) 50 mm from the upper surface of the slot array
- Figure B.10 – 30 GHz patterns of |Etotal| and Re{S}total for the pyramidal horn loaded with a slot arrayat distances of a) 2 mm, b) 5 mm, c) 10 mm, and d) 50 mm from the upper surface of the slot array
- Figure B.11 – 60 GHz patterns of |Etotal| and Re{S}total for the pyramidal horn loaded with a slot arrayat distances of a) 2 mm, b) 5 mm, c) 10 mm, and d) 50 mm from the upper surface of the slot array
- Figure B.12 – 90 GHz patterns of |Etotal| and Re{S}total for the pyramidal horn loaded with a slot arrayat distances of a) 2 mm, b) 5 mm, c) 10 mm, and d) 50 mm from the upper surface of the slot array [Go to Page]
- B.4.4 Far-field radiation patterns
- B.5 Antenna validation procedure [Go to Page]
- B.5.1 General
- Figure B.13 – Far-field radiation patterns of a) 10 GHz, b) 30 GHz,c) 60 GHz, and d) 90 GHz pyramidal horn loaded with a slot array [Go to Page]
- B.5.2 Objectives, scope, and usage specifications
- B.5.3 Antenna design
- B.5.4 Numerical targets
- B.5.5 Reference antennas calibration
- B.5.6 Antenna verification and life expectation
- B.5.7 Uncertainty budget considerations
- B.6 Validation procedure for wideband signals [Go to Page]
- B.6.1 General
- B.6.2 Validation signals
- B.6.3 Validation antennas and setup
- B.6.4 Target values for validation antennas transmitting wideband signals
- B.6.5 Wideband signal uncertainty
- B.6.6 Validation procedure
- Annex C (normative)Calibration and characterization of measurement probes [Go to Page]
- C.1 General
- C.2 Calibration of waveguide probes [Go to Page]
- C.2.1 General
- C.2.2 Sensitivity
- C.2.3 Linearity
- C.2.4 Lower detection limit
- C.2.5 Isotropy
- C.2.6 Response time
- C.3 Calibration for isotropic scalar E-field or H-field probes [Go to Page]
- C.3.1 General
- C.3.2 Sensitivity
- C.3.3 Isotropy
- C.3.4 Linearity
- C.3.5 Lower detection limit
- C.3.6 Response time
- C.4 Calibration of phasor E-field or H-field probes [Go to Page]
- C.4.1 General
- C.4.2 Sensitivity
- C.4.3 Isotropy
- C.4.4 Linearity
- C.4.5 Lower detection limit
- C.5 Calibration uncertainty parameters [Go to Page]
- C.5.1 General
- C.5.2 Input power to the antenna
- C.5.3 Mismatch effect (input power measurement)
- C.5.4 Gain and offset distance
- C.5.5 Signal spectrum
- C.5.6 Setup stability
- C.5.7 Uncertainty for field impedance variations
- C.6 Uncertainty budget template
- Table C.1 – Uncertainty analysis of the probe calibration
- Annex D (informative)Information on use of square or circular shapes for power density averaging area in conformity evaluations [Go to Page]
- D.1 General
- D.2 Method using computational analysis
- D.3 Areas averaged with square and circular shapes on planar evaluation surface
- Figure D.1 – Schematic view of the assessment of the variationof sPD using square shape by rotating AUT (antenna under test)
- Figure D.2 – Comparison of psPD averaged using square versus circular shaped areas on planar evaluation surfaces
- D.4 Areas averaged with square and circular shapes on nonplanar evaluation surface
- Figure D.3 – Example PD distributions withdevice next to ear evaluation surface
- Table D.1 – Phase shift values for the array antenna
- Figure D.4 – Comparison of psPD averaged using cube cross-section (square-like) versus sphere cross-section (circular-like) shaped areas fordevice next to ear evaluation surface
- Annex E (informative)Reconstruction algorithms [Go to Page]
- E.1 General
- E.2 Methodologies to extract local field components and power densities [Go to Page]
- E.2.1 General
- E.2.2 Phase-less approaches
- E.2.3 Approaches using E-field polarization ellipse measurements
- E.2.4 Direct near-field measurements
- E.3 Forward transformation (propagation) of the fields [Go to Page]
- E.3.1 General
- Figure E.1 – Simulation (left) and forward transformation from measurements applying methods described in [29] (right) of power density in the xz-plane (above) and yz-plane (below) at a distance of 2 mm for a cavity-fed dipole array at 30 GHz (see Annex B) [Go to Page]
- E.3.2 Field expansion methods
- E.3.3 Field integral equation methods
- E.4 Backward transformation (propagation) of the fields [Go to Page]
- E.4.1 General
- E.4.2 Field expansion methods – the plane wave expansion
- E.4.3 Inverse source methods
- E.5 Analytical reference functions
- Table E.1 – List of analytical reference functionsand associated psPDn+ target values
- Table E.2 – List of analytical reference functionsand associated psPDtot+ target values
- Table E.3 – List of analytical reference functionsand associated psPDmod+ target values
- Annex F (normative)Interlaboratory comparisons [Go to Page]
- F.1 Purpose
- F.2 Reference devices
- F.3 Power setup
- F.4 Interlaboratory comparison – procedure
- Annex G (informative)PD test and verification example [Go to Page]
- G.1 Purpose
- G.2 DUT overview
- G.3 Test system verification
- G.4 Test setup
- G.5 Power density results
- G.6 Combined exposure (Total Exposure Ratio)
- Annex H (informative)Applicability of plane-wave equivalent approximations [Go to Page]
- H.1 Objective
- H.2 Method
- H.3 Results
- H.4 Discussion
- Figure H.1 – psPDpwe / psPDtot as function of distance (in units of λ) from cavity-fed dipole array (CDA##G, left-side) and pyramidal horn with slot arrays (SH##G,right-side) operating at 10 GHz, 30 GHz, 60 GHz, and 90 GHz
- Annex I (informative)Rationales for concepts and methods applied inthis document and IEC/IEEE 63195-2 [Go to Page]
- I.1 Frequency range
- I.2 Calculation of sPD [Go to Page]
- I.2.1 Application of the Poynting vector for calculation of incident power density
- I.2.2 Averaging area
- Bibliography [Go to Page]