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BS ISO 15932:2013 Microbeam analysis. Analytical electron microscopy. Vocabulary, 2013

Section sec_0
Section sec_1
Section sec_2
Section sec_2.1
Section sec_2.1.1
Section sec_2.1.1.1
Section sec_2.1.1.2
Section sec_2.1.2
Section sec_2.1.2.1
Section sec_2.1.2.2
Section sec_2.1.2.2.1
Section sec_2.1.2.2.2
Section sec_2.1.3
Section sec_2.1.3.1
Section sec_2.1.3.2
Section sec_2.1.4
Section sec_2.1.5
Section sec_2.2
Section sec_2.2.1
Section sec_2.2.1.1
Section sec_2.2.2
Section sec_2.2.2.1
Section sec_2.2.2.2
Section sec_2.2.2.3
Section sec_2.2.2.4
Section sec_2.2.3
Section sec_2.3
Section sec_2.3.1
Section sec_2.3.2
Section sec_2.4
Section sec_2.5
Section sec_2.5.1
Section sec_2.5.2
Section sec_2.5.3
Section sec_2.5.4
Section sec_2.5.5
Section sec_2.6
Section sec_2.6.1
Section sec_2.7
Section sec_2.8
Section sec_2.9
Section sec_3
Section sec_3.1
Section sec_3.1.1
Section sec_3.1.2
Section sec_3.1.2.1
Section sec_3.1.2.2
Section sec_3.1.2.3
Section sec_3.1.3
Section sec_3.1.3.1
Section sec_3.1.3.2
Section sec_3.1.3.3
Section sec_3.1.3.4
Section sec_3.1.3.5
Section sec_3.1.3.6
Section sec_3.1.4
Section sec_3.1.5
Section sec_3.1.6
Section sec_3.1.7
Section sec_3.2
Section sec_3.2.1
Section sec_3.2.2
Section sec_3.2.2.1
Section sec_3.2.2.2
Section sec_3.2.2.3
Section sec_3.2.3
Section sec_3.2.3.1
Section sec_3.2.3.2
Section sec_3.2.3.3
Section sec_3.2.3.4
Section sec_3.2.3.5
Section sec_3.2.4
Section sec_3.2.5
Section sec_3.2.5.1
Section sec_3.2.6
Section sec_3.2.7
Section sec_3.2.8
Section sec_3.2.8.1
Section sec_3.2.9
Section sec_3.2.9.1
Section sec_3.2.10
Section sec_3.3
Section sec_3.4
Section sec_3.4.1
Section sec_3.4.2
Section sec_3.4.3
Section sec_3.4.4
Section sec_3.4.5
Section sec_3.4.6
Section sec_3.4.7
Section sec_3.4.8
Section sec_3.5
Section sec_3.6
Section sec_3.7
Section sec_3.7.1
Section sec_4
Section sec_4.1
Section sec_4.2
Section sec_4.3
Section sec_4.4
Section sec_4.5
Section sec_4.5.1
Section sec_4.6
Section sec_4.7
Section sec_4.8
Section sec_4.9
Section sec_4.10
Section sec_4.11
Section sec_4.12
Section sec_5
Section sec_5.1
Section sec_5.2
Section sec_5.3
Section sec_5.4
Section sec_5.4.1
Section sec_5.4.1.1
Section sec_5.4.1.2
Section sec_5.5
Section sec_5.6
Section sec_5.7
Section sec_5.8
Section sec_5.9
Section sec_5.9.1
Section sec_5.9.2
Section sec_5.9.3
Section sec_5.9.4
Section sec_5.9.5
Section sec_5.9.6
Section sec_6
Section sec_6.1
Section sec_6.1.1
Section sec_6.1.2
Section sec_6.1.3
Section sec_6.1.4
Section sec_6.2
Section sec_6.2.1
Section sec_6.3
Section sec_6.4
Section sec_6.4.1
Section sec_6.4.2
Section sec_6.4.3
Section sec_6.5
Section sec_6.5.1
Section sec_6.5.1.1
Section sec_6.5.1.2
Section sec_6.5.2
Section sec_6.5.3
Section sec_6.5.4
Section sec_6.6
Section sec_6.6.1
Section sec_6.6.2
Section sec_6.6.3
Section sec_6.6.4
Section sec_6.6.5
Section sec_6.6.6
Section sec_6.6.7
Section sec_6.6.8
Section sec_6.6.9
Section sec_6.6.9.1
Section sec_6.6.10
Section sec_6.7
Section sec_6.8
Section sec_6.9
Section sec_6.10
Section sec_6.11
Section sec_6.12
Section sec_6.12.1
Section sec_6.12.2
Section sec_6.12.3
Section sec_6.13
Section sec_7
Section sec_7.1
Section sec_7.2
Section sec_7.2.1
Section sec_7.2.2
Section sec_7.3
Section sec_7.4
Section sec_7.5
Section sec_7.6
Section sec_7.7
Section sec_7.8
Section sec_7.8.1
Section sec_7.9
Section sec_7.10
Section sec_8
Section sec_8.1
Section sec_8.2
Section sec_8.3
Section sec_8.3.1
Section sec_8.3.2
Section sec_8.3.3
Section sec_8.3.3.1
Section sec_8.3.3.2
Section sec_8.3.4
Section sec_8.3.5
Section sec_8.3.6
Section sec_8.4
Section sec_8.5
Section sec_8.5.1
Section sec_8.5.2
Section sec_8.5.3
Section sec_8.5.3.1
Section sec_8.5.4
Section sec_8.5.5
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Foreword
Introduction
0 Scope
1 Abbreviated terms
2 Definitions of terms used in the physical basis of AEM
3 Definitions of terms used in AEM instrumentation
4 Definitions of terms used in specimen preparation of AEM
5 Definitions of terms used in AEM image formation and processing
6 Definitions of terms used in AEM image interpretation and analysis
7 Definitions of terms used in the measurement and calibration of AEM image magnification and resolution
8 Definitions of terms used in electron diffraction in AEM
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