ASTM E1855-96
Historical Standard: ASTM E1855-96 Standard Test Method for Use of 2N2222A Silicon Bipolar Transistors as Neutron Spectrum Sensors and Displacement Damage Monitors
SUPERSEDED (see Active link, below)
ASTM E1855
1. Scope
1.1 This test method covers how 2N2222A silicon bipolar transistors can be used either as dosimetry sensors in the determination of neutron energy spectra, or as silicon 1-MeV equivalent displacement damage fluence monitors.
2. Referenced Documents (purchase separately) The documents listed below are referenced within the subject standard but are not provided as part of the standard.
ASTM Standards
E170 Terminology Relating to Radiation Measurements and Dosimetry
E261 Practice for Determining Neutron Fluence, Fluence Rate, and Spectra by Radioactivation Techniques
E265 Test Method for Measuring Reaction Rates and Fast-Neutron Fluences by Radioactivation of Sulfur-32
E720 Guide for Selection and Use of Neutron Sensors for Determining Neutron Spectra Employed in Radiation-Hardness Testing of Electronics
E721 Guide for Determining Neutron Energy Spectra from Neutron Sensors for Radiation-Hardness Testing of Electronics
E722 Practice for Characterizing Neutron Fluence Spectra in Terms of an Equivalent Monoenergetic Neutron Fluence for Radiation-Hardness Testing of Electronics
E844 Guide for Sensor Set Design and Irradiation for Reactor Surveillance, E 706 (IIC)
E944 Guide for Application of Neutron Spectrum Adjustment Methods in Reactor Surveillance, E 706 (IIA)
E1854 Practice for Ensuring Test Consistency in Neutron-Induced Displacement Damage of Electronic Parts
E2005 Guide for Benchmark Testing of Reactor Dosimetry in Standard and Reference Neutron Fields
E2450 Practice for Application of CaF2(Mn) Thermoluminescence Dosimeters in Mixed Neutron-Photon Environments
Keywords
displacement damage; neutron damage; radiation hardness; silicon transistors; spectrum sensors; Damage assessment--nuclear materials/applications; Displacement--electronic materials/applications; Radiation-hardness testing; Silicon bipolar transistors; Spectrum sensors ;
ICS Code
ICS Number Code 31.200 (Integrated circuits. Microelectron)
DOI: 10.1520/E1855-96
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