ASTM E801-01
Historical Standard: ASTM E801-01 Standard Practice for Controlling Quality of Radiological Examination of Electronic Devices
SUPERSEDED (see Active link, below)
ASTM E801
1. Scope
1.1 This practice relates to the radiological examination of electronic devices for internal discontinuities, extraneous material, missing components, crimped or broken wires, and defective solder joints in cavities, in the encapsulating materials, or the boards. Requirements expressed in this practice are intended to control the quality and repeatability of the radiological images and are not intended for controlling the acceptability or quality of the electronic devices imaged.
Note 1Refer to the following publications for pertinent information on methodology and safety and protection: Guide E 94, and 'General Safety Standard for Installation Using Non-Medical X Ray and Sealed Gamma Ray Sources, Energies Up to 10 MeV Equipment Design and Use,' Handbook No. 114.
1.2 If a nondestructive testing agency as described in Practice E 543 is used to perform the examination, the testing agency should meet the requirements of Practice E 543.
1.3 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.
2. Referenced Documents (purchase separately) The documents listed below are referenced within the subject standard but are not provided as part of the standard.
ASTM Standards
E94 Guide for Radiographic Examination
E543 Specification for Agencies Performing Nondestructive Testing
E1000 Guide for Radioscopy
E1255 Practice for Radioscopy
E1316 Terminology for Nondestructive Examinations
Keywords
 electronic devices; IQI's; radiography; radioscopy; shim; wire ; Electronic materials/applications; Penetrameters; Quality control (QC)--radiographic testing; Radiographic examination
ICS Code
ICS Number Code 19.100 (Non-destructive testing)
DOI: 10.1520/E0801-01
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