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Description of BS EN 61788-15:2011 2012This part of IEC 61788 describes measurements of the intrinsic surface impedance (ZS) of HTS films at microwave frequencies by a modified two-resonance mode dielectric resonatormethod [13, 14]2. The object of measurement is to obtain the temperature dependence of the intrinsic ZS at the resonant frequenc y f0. The frequency and thickness range and the measurement resolution for the intrinsic ZS of HTS films are as follows:
The intrinsic ZS data at the measured frequency, and that scaled to 10 GHz, assuming the f2 rule for the intrinsic surface resistance RS (f < 40 GHz) and the f rule for the intrinsic surface reactance XS for comparison, shall be reported.
About BSIBSI Group, also known as the British Standards Institution is the national standards body of the United Kingdom. BSI produces technical standards on a wide range of products and services and also supplies certification and standards-related services to businesses. |
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