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  • BSI
    BS EN 62215-3:2013 Integrated circuits. Measurement of impulse immunity - Non-synchronous transient injection method
    Edition: 2013
    $442.60
    / user per year

Description of BS EN 62215-3:2013 2013

IEC 62215-3:2013 specifies a method for measuring the immunity of an integrated circuit (IC) to standardized conducted electrical transient disturbances. The disturbances, not necessarily synchronized to the operation of the device under test (DUT), are applied to the IC pins via coupling networks. This method enables understanding and classification of interaction between conducted transient disturbances and performance degradation induced in ICs regardless of transients within or beyond the specified operating voltage range.

Standard NumberBS EN 62215-3:2013
TitleIntegrated circuits. Measurement of impulse immunity - Non-synchronous transient injection method
StatusDefinitive
Publication Date2013-10-31
Identical National Standard OfEN 62215-3:2013, IEC 62215-3:2013
DescriptorsSemiconductors, Test equipment, Electrical measurement, Transient voltages, Impulse voltages, Electromagnetic compatibility, Impulse-voltage tests, Integrated circuits, Electronic equipment and components
ICS31.200 Integrated circuits. Microelectronics
CommitteeEPL/47
ISBN978 0 580 69165 2
PublisherBSI
Pages36

About BSI

BSI Group, also known as the British Standards Institution is the national standards body of the United Kingdom. BSI produces technical standards on a wide range of products and services and also supplies certification and standards-related services to businesses.
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