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  • BSI
    BS IEC 62951-6:2019 Semiconductor devices. Flexible and stretchable semiconductor devices - Test method for sheet resistance of flexible conducting films
    Edition: 2019
    $435.35
    / user per year

Description of BS IEC 62951-6:2019 2019

IEC 62951-6:2019 specifies terms, as well as the test method and report of sheet resistance of the flexible conducting film under bending and folding tests. The measurement methods include the 2-point probe, 4-point probe and Montgomery method, which can be applied to in-situ and ex-situ measurement and the measurements of anisotropic sheet resistance.

Standard NumberBS IEC 62951-6:2019
TitleSemiconductor devices. Flexible and stretchable semiconductor devices - Test method for sheet resistance of flexible conducting films
StatusDefinitive
Publication Date2019-05-15
Identical National Standard OfIEC 62951-6 Ed.1.0
DescriptorsSemiconductor devices, Test methods, Measurement, Thin films, Bend testing
ICS31.080.99 Other semiconductor devices
CommitteeEPL/47
ISBN978 0 580 97293 5
PublisherBSI
Pages28

About BSI

BSI Group, also known as the British Standards Institution is the national standards body of the United Kingdom. BSI produces technical standards on a wide range of products and services and also supplies certification and standards-related services to businesses.
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