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  • BSI
    BS ISO 13067:2020 Microbeam analysis. Electron backscatter diffraction. Measurement of average grain size
    Edition: 2020
    $442.60
    / user per year

Description of BS ISO 13067:2020 2020

This document describes procedures for measuring average grain size derived from a two-dimensional polished cross-section using electron backscatter diffraction (EBSD). This requires the measurement of orientation, misorientation and pattern quality factor as a function of position in the crystalline specimen[ 1]. The measurements in this document are made on two dimensional sections. The reader should note carefully the definitions used (3.3) which draw a distinction between the measured sectional grain sizes, and the mean grain size which can be derived from them that relates to the three dimensional grain size.

NOTE 1

While conventional methods for grain size determination using optical microscopy are well-established, EBSD methods offer a number of advantages over these techniques, including increased spatial resolution and quantitative description of the orientation of the grains.

NOTE 2

The method also lends itself to the measurement of the grain size of complex materials, for example those with a significant duplex content.

NOTE 3

The reader is warned to interpret the results with care when attempting to investigate specimens with high levels of deformation.



About BSI

BSI Group, also known as the British Standards Institution is the national standards body of the United Kingdom. BSI produces technical standards on a wide range of products and services and also supplies certification and standards-related services to businesses.

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