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  • BSI
    DD IEC/TS 62215-2:2007 Integrated circuits. Measurement of impulse immunity - Synchronous transient injection method
    Edition: 2007
    $435.35
    / user per year

Description of DD IEC/TS 62215-2:2007 2007

Contains general information and definitions on the test method to evaluate the immunity of integrated circuits (ICs) against fast conducted synchronous transient disturbances.The objective is to describe general conditions to obtain a quantitative measure of immunity of ICs establishing a uniform testing environment. Critical parameters that are expected to influence the test results are described. Deviations from this specification should be explicitly noted in the individual test report. This synchronous transient immunity measurement method uses short impulses with fast rise times of different amplitude, duration and polarity in a conductive mode to the IC. In this method, the applied impulse has to be synchronized with the activity of the IC to make sure that controlled and reproducible conditions can be assured

Standard NumberDD IEC/TS 62215-2:2007
TitleIntegrated circuits. Measurement of impulse immunity - Synchronous transient injection method
StatusDefinitive
Publication Date2007-11-30
Identical National Standard OfIEC/TS 62215-2:2007
DescriptorsIntegrated circuits, Electrical measurement, Impulse voltages, Transient voltages, Electromagnetic compatibility, Electronic equipment and components, Semiconductors, Impulse-voltage tests, Test equipment
ICS31.200 Integrated circuits. Microelectronics
CommitteeEPL/47
ISBN978 0 580 55691 3
PublisherBSI
Pages28

About BSI

BSI Group, also known as the British Standards Institution is the national standards body of the United Kingdom. BSI produces technical standards on a wide range of products and services and also supplies certification and standards-related services to businesses.
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