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BS IEC/IEEE 63195-2:2022 Assessment of power density of human exposure to radio frequency fields from wireless devices in close proximity to the head and body (frequency range of 6 GHz to 300 GHz) - Computational procedure, 2022
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- English [Go to Page]
- CONTENTS
- FOREWORD
- INTRODUCTION
- 1 Scope
- 2 Normative references
- 3 Terms and definitions [Go to Page]
- 3.1 Exposure metrics and parameters
- 3.2 Spatial, physical, and geometrical parameters associated with exposure metrics
- 3.3 Test device technical operating and antenna parameters
- 3.4 Computational parameters
- 3.5 Uncertainty parameters
- 4 Symbols and abbreviated terms [Go to Page]
- 4.1 Symbols [Go to Page]
- 4.1.1 Physical quantities
- 4.1.2 Constants
- 4.2 Abbreviated terms
- 5 Overview and application of this document [Go to Page]
- 5.1 Overview of the numerical evaluation
- 5.2 Application of this document
- Figures [Go to Page]
- Figure 1 – Overview of the numerical power density evaluation procedure
- 5.3 Stipulations
- 6 Requirements on the numerical software
- 7 Model development and validation [Go to Page]
- 7.1 General
- 7.2 Development of the numerical model of the DUT
- 7.3 Power normalization
- 7.4 Requirements on the experimental test equipment for model validation [Go to Page]
- 7.4.1 General
- Figure 2 – Power reference planes [Go to Page]
- 7.4.2 Ambient conditions and device holder
- 7.4.3 Power measurement
- 7.5 Testing configurations for the validation of the DUT model [Go to Page]
- 7.5.1 General
- 7.5.2 Tests to be performed
- 7.5.3 Determining the validity of the DUT model
- 7.5.4 Test reduction for additional DUTs
- 8 Power density computation and averaging [Go to Page]
- 8.1 Evaluation surface
- 8.2 Tests to be performed and DUT configurations [Go to Page]
- 8.2.1 General
- 8.2.2 Devices with a single radiating element or with multiple elements that do not operate simultaneously
- 8.2.3 Devices with antenna arrays or sub-arrays
- Figure 3 – Example for configurations of radiating elementsas different antenna sub-arrays on the same DUT [Go to Page]
- 8.2.4 Devices with multiple antennas or multiple transmitters
- Figure 4 – Flow chart for the evaluation of power density forDUTs with antenna arrays or sub-arrays as described in 8.2.3
- 8.3 Considerations on the evaluation surface and dimensions of the computational domain
- 8.4 Averaging of power density on an evaluation surface [Go to Page]
- 8.4.1 General
- 8.4.2 Construction of the averaging area on an evaluation surface
- 8.5 Computation of sPD by integration of the Poynting vector [Go to Page]
- 8.5.1 General
- 8.5.2 Surface-normal propagation-direction power density into the evaluation surface, sPDn+
- Figure 5 – Example of the construction of the averaging area withina sphere with fixed radius according to 8.4 [Go to Page]
- 8.5.3 Total propagating power density into the evaluation surface, sPDtot+
- 8.5.4 Total power density directed into the phantom considering near-field exposure, sPDmod+
- 8.6 Software
- 9 Uncertainty evaluation [Go to Page]
- 9.1 General
- 9.2 Uncertainty of the sPD and of the mpsPD due to the computational parameters [Go to Page]
- 9.2.1 Uncertainty contributions due to the computational parameters
- 9.2.2 Mesh resolution
- Tables [Go to Page]
- Table 1 – Budget of the uncertainty contributions ofthe computational algorithm for the validation setup or testing setup [Go to Page]
- 9.2.3 Absorbing boundary conditions
- 9.2.4 Power budget
- 9.2.5 Model truncation
- 9.2.6 Convergence
- 9.2.7 Dielectric properties
- 9.2.8 Lossy conductors
- 9.3 Uncertainty contribution of the computational representation of the DUT model
- 9.4 Uncertainty of the maximum exposure evaluation
- Table 2 – Budget of the uncertainty of the developed model of the DUT
- 9.5 Uncertainty budget
- Table 3 – Computational uncertainty budget
- 10 Reporting
- Annex A (normative)Code verification [Go to Page]
- A.1 General
- A.2 Interpolation and superposition of vector field components
- Figure A.1 – Configuration of three λ/2 dipoles, D1, D2, and D3, for the evaluation of the interpolation and superposition of the electric field and magnetic field components
- Table A.1 – Interpolation and superposition of vector field components; maximum permissible deviation from the reference results is 10 %
- A.3 Computation of the far-field pattern and the radiated power
- A.4 Implementation of lossy conductors
- Table A.2 – Computation of PR; maximum permissible deviation fromthe reference results is 10 % for the radiated power and for the electric field amplitude of the far-field pattern
- Figure A.2 – R320 waveguide
- A.5 Implementation of anisotropic dielectrics
- Figure A.3 – Cross section of the R320 waveguide showingthe locations of the Ey components to be recorded
- Table A.3 – Minimum fine and coarse mesh step for used method
- Table A.4 – Results of the evaluation of the computational dispersion characteristics
- A.6 Computation of the sPD and psPD [Go to Page]
- A.6.1 General
- Table A.5 – Results of the evaluation of the representation of anisotropic dielectrics
- Table A.6 – Parameters for the incident power density distribution of Formula (A.4) [Go to Page]
- A.6.2 Planar surfaces
- Figure A.4 – Si(x,y) computed with Formula (A.4) for the six parametersets of Table A.6 normalized to their maxima [Go to Page]
- A.6.3 Non-planar surfaces
- Figure A.5 – Cross sections of the symmetric quarters of the testing geometries (SAR Stars) for the benchmarking of the power density averaging algorithm
- Figure A.6 – Areas for the computation of the sPD on a cone of the SAR Star
- A.7 Implementation of the field extrapolation according to the surface equivalence principle
- Annex B (informative)Experimental evaluation of the radiated power [Go to Page]
- B.1 General
- B.2 Direct conducted power measurements
- Table B.1 – Comparison of the experimental methodsfor the evaluation of the radiated power
- B.3 Radiated power measurement methods
- B.4 Information provided by the DUT
- Annex C (normative)Maximum-exposure evaluation techniques [Go to Page]
- C.1 General
- C.2 Evaluation of EM fields radiated by each antenna element
- C.3 Evaluation of the mpsPD by superposition of individual EM fields [Go to Page]
- C.3.1 General
- C.3.2 Maximization over the entire codebook by exhaustive search
- C.3.3 Optimization with fixed total conducted power
- C.3.4 Optimization with fixed power at each port
- Annex D (informative)Examples of the implementation of power density averaging algorithms [Go to Page]
- D.1 Example for the evaluation of the psPD on a planar surface [Go to Page]
- D.1.1 General
- D.1.2 Evaluation of the psPD by direct construction of the averaging area
- D.1.3 Example for the efficient evaluation of the psPD using an equidistant mesh on the evaluation surface
- D.2 Example for the evaluation of the psPD on a non-planar surface
- Figure D.1 – Rotated averaging area on the discretized evaluation surface (base mesh)
- Figure D.2 – Reduction of the area of triangles thatare partially included in the averaging sphere
- Annex E (informative)File format for exchange of field data
- Annex F (informative)Rationales of the methods applied inIEC/IEEE 63195-1 and this document [Go to Page]
- F.1 Frequency range
- F.2 Computation of sPD [Go to Page]
- F.2.1 Application of the Poynting vector for computation of incident power density
- F.2.2 Averaging area
- Annex G (informative)Square averaging area on non-planar evaluation surfaces [Go to Page]
- G.1 General
- G.2 Example implementation for the evaluation of the psPD on a non-planar surface using square-shaped averaging area
- Annex H (informative)Validation of the maximum-exposure evaluation techniques [Go to Page]
- H.1 General
- H.2 Validation of the exhaustive search [Go to Page]
- H.2.1 Validation of the exhaustive search
- H.2.2 Validation using reconstruction method
- H.2.3 Validation of optimization with fixed total conducted power or with fixed power at each port
- H.2.4 Validation of the maximum-exposure evaluation of measurement results
- H.3 Example validation source for maximum-exposure evaluation validation [Go to Page]
- H.3.1 Description
- Table H.1 – Main dimensions for the patch array stencil
- Table H.2 – Main dimensions of the validation device
- Figure H.1 – Main dimensions of patch array stencil [Go to Page]
- H.3.2 Positioning
- Figure H.2 – Main dimensions of the validation device, including polypropylene casing
- Figure H.3 – Validation device with SAM head in the tilt position [Go to Page]
- H.3.3 Nominal codebook, uncertainty and conducted power PR
- H.3.4 Target values
- Figure H.4 – Validation device with SAM head in the touch position
- Table H.3 – Target values for validation device with the nominal codebook
- Table H.4 – Target values for validation device with infinite codebook
- Annex I (normative)Supplemental files and their checksums
- Bibliography [Go to Page]
