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eLibrary >
BS ISO 3951-1:2022 - TC Tracked Changes. Sampling procedures for inspection by variables - Specification for single sampling plans indexed by acceptance quality limit (AQL) for lot-by-lot inspection for a single quality characteristic and a single AQL >
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BS ISO 3951-1:2022 - TC Tracked Changes. Sampling procedures for inspection by variables - Specification for single sampling plans indexed by acceptance quality limit (AQL) for lot-by-lot inspection for a single quality characteristic and a single AQL, 2022
- National foreword [Go to Page]
- Contractual and legal considerations
- Compliance with a British Standard cannot confer immunity from legal obligations.
- Amendments/corrigenda issued since publication
- COPYRIGHT PROTECTED DOCUMENT
- Foreword
- Introduction [Go to Page]
- CAUTION — The procedures in this part of ISO 3951document are not suitable for application to lots that have been screened for nonconforming items. [Go to Page]
- Table 1 — Summary table
- INTERNATIONAL STANDARD ISO 3951-1:2013ISO 3951-1:2022(E)
- 1 Scope
- 2 Normative references
- 3 Terms and definitions [Go to Page]
- 3.1
- 3.2
- 3.3
- 3.4
- 3.5
- 3.6
- 3.7
- 3.8
- 3.9
- 3.10
- 3.11
- 3.12 [Go to Page]
- 3.123.13
- 3.133.14
- 3.143.15 [Go to Page]
- L
- 3.153.16 [Go to Page]
- U
- 3.163.17
- 3.173.18 [Go to Page]
- k
- 3.19
- 3.183.20 [Go to Page]
- Q
- 3.193.21
- 3.203.22 [Go to Page]
- 3.21
- 3.223.23
- 3.233.24
- 3.243.25
- 4 Symbols [Go to Page]
- 5 Acceptance quality limit (AQL) [Go to Page]
- 5.1 Concept
- 5.2 Use
- 5.3 Specifying AQLs
- 5.4 Preferred AQLs
- 5.5 Caution
- 5.6 Limitation
- 5 Choice of a sampling plan [Go to Page]
- 5.1 Choice between variables and attributes
- 5.2 General
- 5.3 Choice between the s-method and σ-method
- 5.4 Choice of inspection level and AQL
- 6 Standard procedures for the s-method [Go to Page]
- 6.1 General
- 6.2 Single specification limits
- 6.3 Double specification limits
- 7 Standard procedures for the σ-method [Go to Page]
- 7.1 General
- 7.2 Single specification limits
- 7.3 Double specification limits
- 8 The p*-method
- 6 Switching rules for normal, tightened, and reduced inspection
- 9 Switching between inspection severities [Go to Page]
- 9.1 Rules for switching between inspection severities
- 9.2 Records for switching between inspection severities
- 710 Relation to ISO 2859-1 [Go to Page]
- 7.110.1 Similarities
- 7.210.2 Differences
- 8 Consumer protection [Go to Page]
- 8.1 Use of individual plans
- 8.2 Consumer’s risk quality (CRQ) tables
- 8.3 Producer’s risk tables
- 8.4 Operating characteristic (OC) curves
- 911 Allowing for measurement uncertainty [Go to Page]
- 10 Planning
- 11 Choice between variables and attributes
- 12 Choice between the s-method and σ-method
- 12 Normality, data transformations and outliers [Go to Page]
- 12.1 Normality
- 12.2 Data transformations
- 12.3 Outliers
- 13 Choice of inspection level and AQL
- 13 Monitoring and recording of inspection results [Go to Page]
- 13.1 Monitoring of inspection results
- 13.2 Process capability and performance assessment
- 13.3 Monitoring of process parameters
- 14 Choice of sampling scheme [Go to Page]
- 14.1 Standard plans
- 14.2 Special plans
- 14 Tables [Go to Page]
- 14.1 Form k for single sampling plans: s-method [Go to Page]
- Table 2 — Single sampling plans of form k for normal inspection: s–method
- Table 3 — Single sampling plans of form k for tightened inspection: s–method
- Table 4 — Single sampling plans of form k for reduced inspection: s–method
- 14.2 Form k for single sampling plans: σ-method [Go to Page]
- Table 5 — Single sampling plans of form k for normal inspection: σ–method
- Table 6 — Single sampling plans of form k for tightened inspection: σ–method
- Table 6 (continued)
- Table 7 — Single sampling plans of form k for reduced inspection: σ–method
- Table 7 (continued)
- 14.3 Form p* single sampling plans [Go to Page]
- Table 8 — Single sampling plans of form p* for normal inspection (ns sample size for s-method, nσ sample size for σ–method)
- Table 9 — Single sampling plans of form p* for tightened inspection (ns sample size for s-method, nσ sample size for σ–method)
- Table 10 — Single sampling plans of form p* for reduced inspection (ns sample size for s-method, nσ sample size for σ–method)
- 14.4 Values of fσ for maximum process standard deviation (MPSD) [Go to Page]
- Table 11 — Values of fσ for maximum process standard deviation for combined control of double specification limits: σ–method
- 14.5 Supplementary acceptance constants for qualifying towards reduced inspection [Go to Page]
- Table 12 — Supplementary acceptance constants for qualifying towards reduced inspection
- 15 Preliminary operations
- 15 Examples [Go to Page]
- 15.1 General
- 15.2 Examples for the s-method [Go to Page]
- Figure 2 — Example of the use of an acceptance diagram, s–method
- Figure 3 — Example of the use of an acceptance diagram, s–method
- Figure 4 — Example of the use of an acceptance diagram, s–method
- Figure 5 — Example of the use of a standardized acceptance diagram, s–method
- Figure 6 — Example of the use of an acceptance diagram, s–method
- 15.3 Examples for the σ-method [Go to Page]
- Figure 8 — Example of the use of an acceptance diagram, σ–method
- Figure 9 — Example of the use of an acceptance diagram, σ–method
- 15.4 Examples for the p*-method
- 16 Standard procedures for the s-method [Go to Page]
- 16.1 Obtaining a plan, sampling, and preliminary calculations
- 16.2 Acceptability criteria for single specification limits
- 16.3 Graphical method for a single specification limit
- Figure 1 — Example of the use of an acceptance chart for a single specification limit, s—method [Go to Page]
- 16.4 Acceptability criterion for combined control of double specification limits
- 16.4.1 General
- 16.4.2 Procedure for sample size 3
- 16.4.3 Procedure for sample size 4
- For sample size 4 under the s–method, proceed as follows. After calculating the sample mean, , and the sample standard deviation, s, find the applicable value of the coefficient f s from Table D.1, D.2, or D.3. Determine the MSSD (i.e. the maximum all... [Go to Page]
- 16.4.4 Procedure for sample sizes greater than 4
- Figure 2 — Example of the use of an acceptance chart for combined control of double specification limits: s-method with actual scales
- 17 Standard procedures for the σ-method [Go to Page]
- 17.1 Obtaining a plan, sampling, and preliminary calculations [Go to Page]
- Figure 3 — Example of the use of an acceptance chart for combined control of double specification limits: s-method with normalized scales
- 17.2 Acceptability criteria for a single specification limit
- 17.3 Acceptability criterion for combined control of double specification limits
- 18 Procedure during continuing inspection [Go to Page]
- 19 Normality and outliers [Go to Page]
- 19.1 Normality [Go to Page]
- 19.2 Outliers
- 20 Records [Go to Page]
- 20.1 Control charts
- 20.2 Lots that are not accepted
- 21 Operation of switching rules
- 22 Discontinuation and resumption of inspection
- 23 Switching between the s-method and σ-method [Go to Page]
- 23.1 Estimating the process standard deviation
- 23.2 State of statistical control
- 23.3 Switching from the s -method to the σ -method
- 23.4 Switching from the σ -method to the s -method
- 24 Charts B to R — Operating characteristic curves and tabulated values for single sampling plans, normal inspection: s-method [Go to Page]
- 24.1 Operating characteristic curves and tabulated values for sample size code letter B: s-method
- 24.2 Operating characteristic curves and tabulated values for sample size code letter C: s-method
- 24.3 Operating characteristic curves and tabulated values for sample size code letter D: s-method
- 24.15 Operating characteristic curves and tabulated values for sample size code letter R: s-method
- 25 Charts s-D to s-R — Acceptance curves for combined control of double specification limits: s-method [Go to Page]
- Figure 22 — Chart s-F: Acceptance curves for combined control of double specification limits for sample size code letter F under normal and tightened inspection and for sample size code letter H under reduced inspection
- Figure 26 — Chart s-K: Acceptance curves for combined control of double specification limits for sample size code letter K under normal and tightened inspection and for sample size code letter M under reduced inspection
- Figure 27 — Chart s-L: Acceptance curves for combined control of double specification limits for sample size code letter L under normal and tightened inspection and for sample size code letter N under reduced inspection
- Figure 28 — Chart s-M: Acceptance curves for combined control of double specification limits for sample size code letter M under normal and tightened inspection and for sample size code letter P under reduced inspection
- Figure 29 — Chart s-N: Acceptance curves for combined control of double specification limits for sample size code letter N under normal and tightened inspection and for sample size code letter Q under reduced inspection
- Figure 30 — Chart s-P: Acceptance curves for combined control of double specification limits for sample size code letter P under normal and tightened inspection and for sample size code letter R under reduced inspection
- Figure 31 — Chart s-Q: Acceptance curves for combined control of double specification limits for sample size code letter Q under normal and tightened inspection
- Annex A
- Table for determining the sample size code letter
- Annex A
- Procedures for obtaining s and σ [Go to Page]
- A.1 Procedure for obtaining s [Go to Page]
- A.1.1 Definition
- A.1.2 One-pass formula
- A.1.3 Potential numerical inaccuracy
- A.1.4 An updating algorithm for sequential data
- A.1.5 Spreadsheets and pocket calculators
- A.2 Procedure for obtaining σroot [Go to Page]
- A.2.1 Definition
- A.2.2 Simplication for equal sample sizes
- Annex B
- Form k for single sampling plans: s-method [Go to Page]
- Table B.1 — Single sampling plans of Form k for normal inspection: s–method
- Table B.2 — Single sampling plans of Form k for tightened inspection: s–method
- Table B.3 — Single sampling plans of Form k for reduced inspection: s–method
- Annex B
- Accommodating measurement variability [Go to Page]
- B.1 General
- B.2 Process standard deviation σ and measurement standard deviation σm are both known
- B.3 Process standard deviation σ is unknown but measurement standard deviation σm is known
- B.4 Process standard deviation σ and measurement standard deviation σm are both unknown [Go to Page]
- Table B.1 — Sample results for the example of B.4
- Table B.2 — Sample results with subtraction of 12,9 for the example of B.4
- Annex C
- Form k for single sampling plans: σ-method [Go to Page]
- Table C.1 — Single sampling plans of Form k for normal inspection: σ–method
- Table C.2 — Single sampling plans of Form k for tightened inspection: σ–method
- Table C.3 — Single sampling plans of Form k for reduced inspection: σ–method
- Annex C
- Sampling strategies [Go to Page]
- Figure C.1 — Examples of different sampling strategies with a two-dimensional population
- Annex D
- Values of f s for maximum sample standard deviation (MSSD) [Go to Page]
- Table D.1 — Values of f s for maximum sample standard deviation for combined control of double specification limits: normal inspection, s–method
- Table D.2 — Values of f s for maximum sample standard deviation for combined control of double specification limits: tightened inspection, s–method
- Table D.3 — Values of f s for maximum sample standard deviation for combined control of double specification limits: reduced inspection, s–method
- Annex D
- Operating characteristics for the σ–method [Go to Page]
- D.1 Probability of acceptance for the σ-method
- D.2 Example
- D.3 Comparison with tabulated value for the s–method
- Annex E
- Values of fσ for maximum process standard deviation (MPSD) [Go to Page]
- Table E.1 — Values of f σ for maximum process standard deviation for combined control of double specification limits: σ–method
- Annex E
- Operating characteristic for the s-method – tabulated values for single sampling plans, normal inspection [Go to Page]
- E.1 Probability of acceptance for the s-method
- Annex F
- Estimating the process fraction nonconforming for sample size 3: s-method
- Annex F
- Consumer’s risk qualities [Go to Page]
- F.1 The consumer’s risk quality for the s-method plans
- F.2 Tables for the consumer’s risk qualities for the s–method plans
- F.3 The consumer’s risk quality for the σ–method plans
- F.4 Tables for the consumer’s risk qualities for the σ–method plans
- Annex G
- Single sampling plans of Form p*
- Annex G
- Producer’s risks [Go to Page]
- G.1 The producer’s risk for the s-method plans
- G.2 Tables for the producer’s risks for the s–method plans
- G.3 The producer’s risk for the σ–method plans
- G.4 Tables for the producer’s risk for the σ–method plans
- Annex H
- Values of c U for upper control limit on the sample standard deviation [Go to Page]
- Table H.1 — Values of c U for upper control limit on the sample standard deviation
- Annex H
- Construction of acceptance diagrams for double specification [Go to Page]
- H.1 General
- H.2 s-method acceptance diagrams for double specification limits under separate control [Go to Page]
- Figure H.1 — acceptance region, s-method, separate control
- H.3 s-method acceptance diagrams for double specification limits under combined control [Go to Page]
- Figure H.2 — acceptance region, s-method, combined control – construction lines and
- Figure H.3 — acceptance region, s-method, combined control with construction lines and
- H.4 σ-method – determination of combined specification limits acceptance criteria [Go to Page]
- Figure H.8 — acceptance region, σ-method, combined control with sample mean and standard deviation
- H.5 standardized acceptance diagrams for double specification limits under separate control [Go to Page]
- Figure H.10 — standardized acceptance region, s-method, combined control with sample mean and standard deviation
- H.6 Spreadsheet implementation
- Annex I
- Supplementary acceptability constants for qualifying towards reduced inspection [Go to Page]
- Table I.1 — Supplementary acceptability constants for qualifying towards reduced inspection
- Annex I
- Use of the underlying software [Go to Page]
- I.1 Execution of the standard [Go to Page]
- Table I.1 — Function ISO3951_1
- I.2 Operating characteristic functions [Go to Page]
- Table I.2 — Function OC
- I.3 Confidence intervals [Go to Page]
- Table I.3 — Function confint
- I.4 Consumer’s risk quality and the producer’s risk
- I.5 Constructing the acceptance curve for the case with two specification limits and the s-method
- Annex J
- Procedures for obtaining s and σ [Go to Page]
- J.1 Procedure for obtaining s
- J.2 Procedure for obtaining σ
- Annex K
- Consumer’s risk qualities [Go to Page]
- Table K.1 — Consumer’s risk quality (in percent) for normal inspection: s–method
- Table K.2 — Consumer’s risk quality (in percent) for normal inspection: σ–method
- Table K.3 — Consumer’s risk quality (in percent) for tightened inspection: s–method
- Table K.4 — Consumer’s risk quality (in percent) for tightened inspection: σ–method
- Table K.5 — Consumer’s risk quality (in percent) for reduced inspection: s–method
- Table K.6 — Consumer’s risk quality (in percent) for reduced inspection: σ–method
- Annex L
- Producer’s risks [Go to Page]
- Table L.1 — Producer’s risk (in percent) for normal inspection: s–method
- Table L.2 — Producer’s risk (in percent) for normal inspection: σ–method
- Table L.3 — Producer’s risk (in percent) for tightened inspection: s–method
- Table L.4 — Producer’s risk (in percent) for tightened inspection: σ–method
- Table L.5 — Producer’s risk (in percent) for reduced inspection: s–method
- Table L.6 — Producer’s risk (in percent) for reduced inspection: σ–method
- Annex M
- Operating characteristics for the σ-method [Go to Page]
- M.1 Formula for probability of acceptance
- M.2 Example
- M.3 Comparison with tabulated value for the s–method
- Annex N
- Estimating the process fraction nonconforming for sample sizes 3 and 4: s-method [Go to Page]
- N.1 General formula for sample size, n
- N.2 Formula for sample size 3
- N.3 Formula for sample size 4
- Annex O
- Accommodating measurement variability [Go to Page]
- O.1 General
- O.2 Process standard deviation σ and measurement standard deviation σm both known
- O.3 Process standard deviation σ unknown but measurement standard deviation σ m known
- O.4 Process standard deviation σ and measurement standard deviation σ m both unknown
- Bibliography
- Bibliography
- [25] R Foundation for Statistical Computing [online database]. Available from http://www.R-project.org [viewed 17 September 2020].
- Tracked_Changes_Cover_Markup_new.pdf [Go to Page]
- compares BS ISO 3951-1:2022 [Go to Page]
- TRACKED CHANGES
- Text example 1 — indicates added text (in green)
- 30409816.pdf [Go to Page]
- National foreword
- Foreword
- Introduction
- 1 Scope
- 2 Normative references
- 3 Terms and definitions
- 4 Symbols
- 5 Choice of a sampling plan [Go to Page]
- 5.1 Choice between variables and attributes
- 5.2 General
- 5.3 Choice between the s-method and σ-method
- 5.4 Choice of inspection level and AQL
- 6 Standard procedures for the s-method [Go to Page]
- 6.1 General
- 6.2 Single specification limits
- 6.3 Double specification limits
- 7 Standard procedures for the σ-method [Go to Page]
- 7.1 General
- 7.2 Single specification limits
- 7.3 Double specification limits
- 8 The p*-method
- 9 Switching between inspection severities [Go to Page]
- 9.1 Rules for switching between inspection severities
- 9.2 Records for switching between inspection severities
- 10 Relation to ISO 2859-1 [Go to Page]
- 10.1 Similarities
- 10.2 Differences
- 11 Allowing for measurement uncertainty
- 12 Normality, data transformations and outliers [Go to Page]
- 12.1 Normality
- 12.2 Data transformations
- 12.3 Outliers
- 13 Monitoring and recording of inspection results [Go to Page]
- 13.1 Monitoring of inspection results
- 13.2 Process capability and performance assessment
- 13.3 Monitoring of process parameters
- 14 Tables [Go to Page]
- 14.1 Form k for single sampling plans: s-method
- 14.2 Form k for single sampling plans: σ-method
- 14.3 Form p* single sampling plans
- 14.4 Values of fσ for maximum process standard deviation (MPSD)
- 14.5 Supplementary acceptance constants for qualifying towards reduced inspection
- 15 Examples [Go to Page]
- 15.1 General
- 15.2 Examples for the s-method
- 15.3 Examples for the σ-method
- 15.4 Examples for the p*-method
- Annex A (informative) Procedures for obtaining s and σ
- Annex B (informative) Accommodating measurement variability
- Annex C (informative) Sampling strategies
- Annex D (informative) Operating characteristics for the σ–method
- Annex E (informative) Operating characteristic for the s-method – tabulated values for single sampling plans, normal inspection
- Annex F (informative) Consumer’s risk qualities
- Annex G (informative) Producer’s risks
- Annex H (informative) Construction of acceptance diagrams for double specification limits
- Annex I (informative) Use of the underlying software
- Bibliography [Go to Page]
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